IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 108, Number 145

Electromechanical Devices

Workshop Date : 2008-07-18 / Issue Date : 2008-07-11

[PREV] [NEXT]

[TOP] | [2006] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [Japanese] / [English]

[PROGRAM] [BULK PDF DOWNLOAD]


Table of contents

EMD2008-22
Determination of Gain for Double-Ridge Guide Horn Antenna on Basis of Phase Center Location
Katsushige Harima (NICT)
pp. 1 - 4

EMD2008-23
Improvement for Accurate Measurement of finger's Complex Permittivity by Waveguide-Penetration Method
Hikaru Saito, Masaki Kouzai, Takahiro Aoyagi (Tokyo Tech.), Atsuhiro Nishikata (Tokyo Tech./NICT), Soichi Watanabe (NICT)
pp. 5 - 10

EMD2008-24
Estimation of sheet resistance of thin material by using DFFC
Toshihide Tosaka (NICT), Atsuhiro Nishikata (TITECH/NICT), Kaori Fukunaga, Yukio Yamanaka (NICT), Yoshiyuki Yoshimura (IRII)
pp. 11 - 14

EMD2008-25
Immunity Estimation for Printed Circuit Boards to Electrostatic Discharge by Circuit Simulation and Conducted Immunity Measurement of ICs
Yasuhiro Shiraki (Mitsubishi Elec. Corp.)
pp. 15 - 20

EMD2008-26
Validation of Spark Resistance Formula Applied for Human ESD
Yoshinori Taka, Osamu Fujiwara (NIT)
pp. 21 - 26

EMD2008-27
Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT)
pp. 27 - 30

EMD2008-28
Analysis of 3rd-Order Passive Intermodulation gernerated from Metallic Materials
Daijiro Ishibashi, Nobuhiro Kuga (Yokohama Nat'l Univ.)
pp. 31 - 36

EMD2008-29
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (II) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Hiroto Minegishi, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.)
pp. 37 - 42

EMD2008-30
A measurement of the arrival time of the steady contact voltage at the slowly making contacts (Part 2) -- The relationship between AgPd content rate and the arrival time of the steady contact voltage --
Kazuaki Miyanaga, Yoshiki Kayano (Akita Univ.), Tasuku Takagi (Em. Prof. Tohoku University), Hiroshi Inoue (Akita Univ.)
pp. 43 - 48

EMD2008-31
Magnetic drive by a small magnet of break arc occurring between electrical contacts in a DC42V/7-21A circuit
Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.)
pp. 49 - 54

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan