IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 109, Number 161

Reliability

Workshop Date : 2009-07-31 / Issue Date : 2009-07-24

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Table of contents

R2009-22
Simulated annealing algorithm for solving optimal arrangement problems in a linear consecutive-k-out-of-n: F system
Koji Shingyochi (Jumonji Univ.), Hisashi Yamamoto (Tokyo Metropolitan Univ.)
pp. 1 - 6

R2009-23
Design of an Interface Board with a Reconfiguration Method
Hiroshi Mochizuki, Takuya Anzawa, Sei Takahashi, Hideo Nakamura (Nihon Univ.)
pp. 7 - 10

R2009-24
Optimal Reorganization Time of Structural Database Deterioration
Syouji Nakamura (Kinjo Gakuin University), Toshio Nakagawa (AIT)
pp. 11 - 15

R2009-25
Markovian Software Performability Modeling with User-Perceived Performance Degradation
Koichi Tokuno, Shigeru Yamada (Tottori Univ.)
pp. 17 - 22

R2009-26
Hazard Rate Model for Reliability Assessment with Application to Embedded Open Source Software
Yoshinobu Tamura (Yamaguchi Univ.), Shigeru Yamada (Tottori Univ.)
pp. 23 - 28

R2009-27
An Optimal Testing-Effort Expending Problem with Operational Software Reliability
Shinji Inoue, Shigeru Yamada (Tottori Univ.)
pp. 29 - 34

R2009-28
A study on software reliability assessment via bootstrap
Ryota Hakozaki, Tadashi Dohi (Hiroshima Univ.)
pp. 35 - 40

R2009-29
Study of EMEA -- Convinced Human Events and their Effects --
Akihiko Masuda (TUST)
pp. 41 - 45

R2009-30
A Study of Estimation for the Three-ParameterWeibull Distribution under Singly Censored Data
Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.), Tsunenori Ishioka (NCUEE), Hisashi Yamamoto (Tokyo Metropolitan Univ.)
pp. 47 - 51

R2009-31
Top Event Probability of a Repairable Dynamic FT
Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA)
pp. 53 - 58

R2009-32
Performance Evaluation of Security System Using MRSPN
Ryutaro Fujimoto, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 59 - 64

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan