Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [2013] | [Japanese] / [English]
R2010-32
Evaluation of degradation at a solder connected point due to electromigration
Akihiro Higuchi, Kazunori Hiraoka (Salesian Poly.)
pp. 1 - 4
R2010-33
Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling
Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST)
pp. 5 - 8
R2010-34
The improvement of the sealing reliability of relays by the means of reducing permeability in sealing adhesives
Tomohiro Fukuhara, Mitsuo Ito, Osamu Otani (OMRON)
pp. 9 - 13
R2010-35
A Bootstrap Software Reliability Assessment Method in the Final Stage of Software Testing Process
Takaji Fujiwara (Biz3), Mitsuhiro Kimura (Hosei Univ.)
pp. 15 - 20
R2010-36
Inference of Reliability for Degradation Data Based on Stochastic Process Models
Toru Kaise (Univ. of Hyogo)
pp. 21 - 24
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.