IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 110, Number 415

Reliability

Workshop Date : 2011-02-18 / Issue Date : 2011-02-11

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Table of contents

R2010-42
Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication
Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.)
pp. 1 - 6

R2010-43
Direct Viewing of Current in Contact Area used by Light Emission Diode
Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.)
pp. 7 - 12

R2010-44
An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres
Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka)
pp. 13 - 18

R2010-45
Measurement of Contact Resistance Distribution on Electrical Contact Surfaces Eroded by Break Arcs
Yohei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa (Shizuoka Univ.), Takayoshi Kubono (Prof. Emeritus of Shizuoka Univ.)
pp. 19 - 24

R2010-46
Detection of degradation sign of LSI operation using IDDQ
Shunsuke Sakamoto, Masaru Sanada (KUT)
pp. 25 - 30

R2010-47
Logic stabilization of unstable logic circuit with open fault
Taiki Yasutomi, Masaru Sanada (KUT)
pp. 31 - 36

R2010-48
Statistical Quality Control based on Early Life Failure Rate for Electronic Components
Toshinari Matsuoka (MELCO)
pp. 37 - 42

R2010-49
Thermal imaging method with Phase Microscopy
Tomonori Nakamura, Hidenao Iwai, Toyohiko Yamauchi (HPK CRL), Hirotoshi Terada (HPK)
pp. 43 - 48

R2010-50
A Study on Plating Element and Solderbility for Ni/Sn Lath-like Intermetallic
Sadanori Itou (itoken), Masafumi Suzuki (omron)
pp. 49 - 52

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan