IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2011-02-18 / Issue Date : 2011-02-11

EMD2010-143
Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication
Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.)
pp. 1 - 6

EMD2010-144
Direct Viewing of Current in Contact Area used by Light Emission Diode
Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.)
pp. 7 - 12

EMD2010-145
An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres
Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka)
pp. 13 - 18

EMD2010-146
Measurement of Contact Resistance Distribution on Electrical Contact Surfaces Eroded by Break Arcs
Yohei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa (Shizuoka Univ.), Takayoshi Kubono (Prof. Emeritus of Shizuoka Univ.)
pp. 19 - 24

EMD2010-147
Detection of degradation sign of LSI operation using IDDQ
Shunsuke Sakamoto, Masaru Sanada (KUT)
pp. 25 - 30

EMD2010-148
Logic stabilization of unstable logic circuit with open fault
Taiki Yasutomi, Masaru Sanada (KUT)
pp. 31 - 36

EMD2010-149
Statistical Quality Control based on Early Life Failure Rate for Electronic Components
Toshinari Matsuoka (MELCO)
pp. 37 - 42

EMD2010-150
Thermal imaging method with Phase Microscopy
Tomonori Nakamura, Hidenao Iwai, Toyohiko Yamauchi (HPK CRL), Hirotoshi Terada (HPK)
pp. 43 - 48

EMD2010-151
A Study on Plating Element and Solderbility for Ni/Sn Lath-like Intermetallic
Sadanori Itou (itoken), Masafumi Suzuki (omron)
pp. 49 - 52

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan