Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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R2011-8
[Invited Talk]
The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations
-- Non-electrical-contact fault localization in LSI chips --
Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.)
pp. 1 - 6
R2011-9
Observation of Vth Distribution of MONOS Flash Memory Using Scanning Nonlinear Dielectric Microscopy
Koichiro Honda (Fujitsu Labs.), Yasuo Cho (Tohoku Univ.)
pp. 7 - 12
R2011-10
Crystal structure analysis of Carbon Nanotube Forests by XRD
Hiroshi Furuta (KUT)
pp. 13 - 17
R2011-11
Bias-Temperature Instability in Zin Oxide Thin-Film Transistors
Mamoru Furuta, Takahiro Hiramatsu, Tokiyoshi Matsuda, Takashi Hirao (Kochi Univ. of Tech.), Yudai Kamada, Shizuo Fujita (Kyoto Univ.)
pp. 19 - 22
R2011-12
[Invited Talk]
Failure analysis method using a Laser excitation quasi-electrostatic field sensing technique
Seigo Ito, Kiyoaki Takiguchi (Tokyo Univ.)
pp. 23 - 28
R2011-13
Evaluation of defect-tolerance in the quantum-dot cellular automata PLA
Katsuyoshi Miura, Takayuki Notsu, Koji Nakamae (Osaka Univ)
pp. 29 - 34
R2011-14
Candidate Fault Portions Detection using CMOS Transistor Operation Point Analysis
Kazuaki Kishi, Masaru Sanada (KUT)
pp. 35 - 40
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.