IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 113, Number 104

Dependable Computing

Workshop Date : 2013-06-21 / Issue Date : 2013-06-14

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Table of contents

DC2013-10
A Controller Augmentation Method to Generate Functional k-Time Expansion Models for Data Path Circuits
Yusuke Kodama, Jun Nishimaki, Tetsuya Masuda, Toshinori Hosokawa (Nihon Univ), Hideo Fujiwara (Osaka Gakuin Univ)
pp. 1 - 6

DC2013-11
A method of deterministic LFSR seed generation for scan-based BIST
Takanori Moriyasu, Satoshi Ohtake (Oita Univ.)
pp. 7 - 12

DC2013-12
A theretical discussion for testabilty of a degraded LSI in field
Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.)
pp. 13 - 18

DC2013-13
An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault
Takahiro Nagamoto, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.)
pp. 19 - 23

DC2013-14
An Online Interconnect Test of SoC with Boundary Scan Shift and Embedded Reconfigurable Core
Kentaroh Katoh (TNCT)
pp. 25 - 29

DC2013-15
A Method of Transistor Degradation Estimation Using Ring Oscillators
Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.)
pp. 31 - 36

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan