Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2011] | [2012] | [2013] | [2014] | [2015] | [2016] | [2017] | [Japanese] / [English]
DC2014-78
Studies on FPGA Rejuvenation
Aromhack Saysanasongkham, Satoshi Fukumoto (Tokyo Metropolitan Univ.)
pp. 1 - 6
DC2014-79
Study on Reliability Improvements of MLC PCM by Threshold Modification
Shinya Nakano, Masayuki Arai (Nihon Uni.v)
pp. 7 - 12
DC2014-80
Note on Evaluation of Dependable Design Based on Approximate Logic
Haruki Saito, Masayuki Arai (Nihon Uni.v)
pp. 13 - 18
DC2014-81
A Hardware Trojan Circuit Detection Method Based on Information of Nontransitional Lines
Tomohiro Bouyashiki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (KUS)
pp. 19 - 24
DC2014-82
Test Method for Encryption LSI against Scan-based Attacks
Masayoshi Yoshimura (Kyoto Sangyo Univ.), Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.)
pp. 25 - 30
DC2014-83
Report of International Test Conference
ITC Asian Committee (ITC Asian Comm)
pp. 31 - 36
DC2014-84
A Method of Scheduling in High-Level Synthesis for Hierarchical Testability
Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.)
pp. 37 - 42
DC2014-85
A Method of LFSR Seed Generation for Hierarchical BIST
Kosuke Sawaki, Satoshi Ohtake (Oita Univ.)
pp. 43 - 48
DC2014-86
An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets
Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.)
pp. 49 - 54
DC2014-87
A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis
Senling Wang, Taiga Inoue, Hanan T.al-awadhi, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.)
pp. 55 - 60
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.