Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2012] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [Japanese] / [English]
DC2015-16
A test data reduction method based on scan slice on BAST
Makoto Nishikiori, Hiroshi Yamazaki, Toshinori Hosokawa, Masayuki Arai (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.)
pp. 1 - 6
DC2015-17
Study on Fast Bridge Fault Test Generation Based on Critical Area
Masayuki Arai (Nihon Univ.), Shingo Inuyama, Kazuhiko Iwasaki (Tokyo Metro. Univ.)
pp. 7 - 12
DC2015-18
A Method to Identify High Test Power Areas in Layout Design
Kohei Miyase (Kyutech), Matthias Sauer, Bernd Becker (Univ. Freiburg), Xiaoqing Wen, Seiji Kajihara (Kyutech)
pp. 13 - 18
DC2015-19
A Study on Function Test of Latch-based Asynchronous Pipeline Circuits
Daiki Toyoshima, Kyohei Terayama, Atsushi Kurokawa, Masashi Imai (Hirosaki Univ.)
pp. 19 - 24
DC2015-20
Performance Evaluation of Dependability Improvement Methods for Multiple Core Systems based on Markov Models
Masashi Imai (Hirosaki Univ.), Tomohiro Yoneda (NII)
pp. 25 - 30
DC2015-21
Using binary decision diagrams for constraint handling in test case generation
Tatsuhiro Tsuchiya (Osaka Univ.)
pp. 31 - 34
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.