IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 120, Number 222

Ultrasonics

Workshop Date : 2020-11-05 / Issue Date : 2020-10-29

[PREV] [NEXT]

[TOP] | [2017] | [2018] | [2019] | [2020] | [2021] | [2022] | [2023] | [Japanese] / [English]

[PROGRAM] [BULK PDF DOWNLOAD]


Table of contents

US2020-43
Effect of negative ion bombardment increased in low-pressure sputtering deposition on crystallinity and piezoelectric property of ScAlN thin film
Takumi Tominaga, Shinji Takayanagi (Doshisha Univ.), Takahiko Yanagitani (Waseda Univ.)
pp. 1 - 6

US2020-44
Cross-sectional acoustic impedance micro-imaging of human skin using time-frequency dual domain deconvolution
Atsushi Imori, Edo Bagus Prastika, Mai Murakami, Tomohiro Kawashima, Sachiko Yoshida, Naohiro Hozumi (Toyohashi Univ. Tech.), Ryo Nagaoka (Univ. Toyama), Kazuto Kobayashi (Honda Electronics)
pp. 7 - 11

US2020-45
Cantilever damage evaluation using impedance-loaded SAW sensor with continuous wavelet analysis and machine learning
Sena Suzuki, Jun Kondoh (Shizuoka Univ.)
pp. 12 - 17

US2020-46
Development of measurement system using on-line software for SH-SAW sensor
Naoki Maekawa, Jun Kondoh (Shizuoka Univ.)
pp. 18 - 23

US2020-47
Measurements of liquid sound velocity with droplet manipulation based on acoustic streaming caused by surface acoustic wave
Ryota Mitsuyoshi, Jun Kondoh (Shizuoka Univ.)
pp. 24 - 28

US2020-48
Observation of the sound field by the schlieren method in ultrasonic atomization using a horn
Takuya Yoshimoto (AIT), Shin-ichi Hatanaka (UEC), Masanori Sato (Honda Electronics), Teruyuki Kozuka (AIT)
pp. 29 - 33

US2020-49
Resonant frequency shift and lattice strain of AlN and ScAlN SMR during DC bias voltage application caused by nonlinear effect
Takumi Saotome, Takahiko Yanagitani (Waseda Univ.)
pp. 34 - 39

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan