IEICE Technical Report

Online edition: ISSN 2432-6380

Superconductive Electronics

Workshop Date : 2020-11-25 - 2020-11-26 / Issue Date : 2020-11-18

SCE2020-8
Design and bit-error-late evaluation of a Josephson latching driver using 10-kA/cm2 Nb process
Yuki Hironaka, Nobuyuki Yoshikawa (Yokohama Natl. Univ.)
pp. 1 - 6

SCE2020-9
Enhanced Operation Frequencies of Bipolar Double-Flux-Quantum Amplifiers Fabricated Using a Nb 10-kA/cm2 Integration Process
Yuta Somei, Hiroshi Shimada, Yoshinao Mizugaki (UEC)
pp. 7 - 11

SCE2020-10
Development of electron neutrino detector using Indium target and superconducting technology
Hirokazu Ishino (Okayama Univ.), Hirotake Yamamori (AIST), Yuya Nakao (Okayama Univ.), Ryota Takaku (Univ. of Tokyo), Tomotake Matsumura (Kavli IPMU)
pp. 12 - 15

SCE2020-11
Nonlinear conduction of residual quasiparticles in superconductors at extremely low temperature and its effect on the properties of superconducting transmission lines
Takashi Noguchi (NAOJ/RIKEN), Satoru Mima, Chiko Otani (RIKEN)
pp. 16 - 21

SCE2020-12
Fabrication of Lumped Element Kinetic Inductance Device using NbN Thin Film
Yusan Eimoto, Masato Naruse, Tohru Taino, Hiroaki Myoren (Saitama Univ.)
pp. 22 - 25

SCE2020-13
Development of NbN-based superconducting qubit with π-phase shifter
Sunmi Kim (NICT), Taro Yamashita, Haruki Kato (Nagoya Univ.), Wei Qiu, Tomoko Fuse, Fumiki Yoshihara, Kouichi Semba (NICT), Akira Fujimaki (Nagoya Univ.), Hirotaka Terai (NICT)
pp. 26 - 28

SCE2020-14
Fabrication of NbN based ferromagnetic Josephson junction with PdNi barrier layer
Riku Sugimoto, Hayate Nakamura, Duong Pham, Masamitsu Tanaka, Taro Yamashita, Akira Fujimaki (Nagoya Univ.)
pp. 29 - 33

SCE2020-15
High-sensitive readout of superconducting nanowire single-photon detectors using an AQFP comparator
Fumihiro China (NICT), Naoki Takeuchi (Yokohama Natl. Univ.), Shigehito Miki, Masahiro Yabuno, Shigeyuki Miyajima, Hirotaka Terai (NICT)
pp. 34 - 38

SCE2020-16
Evaluation of 16 element superconducting nanostrip single photon detector
Shigehito Miki, Shigeyuki Miyajima, Masahiro Yabuno, Fumihiro China, Hirotaka Terai (NICT)
pp. 39 - 41

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan