IEICE Technical Report

Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2024-02-29 / Issue Date : 2024-02-22

R2023-55
Estimation of the Number of Faults Based on SRGM Considering the Usage Pattern of the Users
Shoichoro Miyamoto, Lei Zhou, Yoshinobu Tamura (Yamaguchi Univ.), Shigeru Yamada (Tottori Univ.)
pp. 1 - 5

R2023-56
Deep Learning-based Lifetime Analysis of a Mission-critical System
Yan Jiawen, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)
pp. 6 - 11

R2023-57
A Note on Dynamic Power Management of Cloud System Using Deep Reinforcement Learning
Dai Xinbo, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 12 - 17

R2023-58
Towards Execution Path Prediction in Software Testing with Code-Understanding Large Language Model
Zhao Yuchi, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 18 - 23

R2023-59
Comparison of Kernel-based Regression Approaches for Software Reliability Prediction
Bai Jiacheng, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)
pp. 24 - 29

R2023-60
Ranking Software Reliability Models: A Bagging Approach
Jingchi Wu, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)
pp. 30 - 35

R2023-61
Algorithm of evaluating network performance for resilience analysis
Kotaro Fujikura, Natsumi Takahashi, Tetsushi Yuge (NDA)
pp. 36 - 41

R2023-62
A probabilistic model on a Gompertz integrable difference equation
Kaito Suzuki, Takeshi Kurosawa (TUS), Daisuke Satoh (NTT)
pp. 42 - 45

R2023-63
Comparison of OSS Reliability Assessment Methods Based on Deep Learning Considering the Wiener and Jump Diffusion Processes
Yoshinobu Tamura, Shoichiro Miyamoto, Lei Zhou (Yamaguchi Univ.), Shigeru Yamada (Tottori Univ.)
pp. 46 - 51

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan