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Paper Abstract and Keywords
Presentation 2017-10-04 14:40
Investigation for Improvement of Crystalline Quality of Cr2O3 Thin Film Deposited on Oxide Single Crystal Substrates
Tsubasa Enomoto, Sinjirou Hukui, Tsuyosi Hirato, Takumi Onodera, Tomoko Nagata, Hirosi Yamamoto, Nobuyuki Iwata (Niti Univ) CPM2017-61
Abstract (in Japanese) (See Japanese page) 
(in English) We prepared Cr2O3, (Cr0.98Fe0.02)2O3, (Cr0.50Fe0. 50)2O3 thin films on r-plane sapphire and YAlO3 substrates. The (Cr0.98Fe0.02)2O3, (Cr 0 .50Fe0. 50)2O 3 thin films grown on the r-plane sapphire substrate show a strong uniaxial anisotropy. The size of the grains of (Cr0.98Fe0.02)2O3 thin film grown on YAlO3 substrate was about 4 times larger than those of Cr2O3 thin film, and the trenches, which appear between grains boundary, are suppressed by less than 50% as well From the results of 2θ -θ spectra, the calculated lattice constant of out-of-plane of (Cr0.98Fe0.02)2O3 and (Cr0.50Fe0.50)2O3 thin films 0.364 nm, which is same as that of Cr2O3 thin film, and 0.367 nm, which is 1.1% larger than that of at Cr2O3 thin film.
Keyword (in Japanese) (See Japanese page) 
(in English) Cr2O3 / films / YAlO3 / / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 224, CPM2017-61, pp. 11-14, Oct. 2017.
Paper # CPM2017-61 
Date of Issue 2017-09-27 (CPM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee CPM  
Conference Date 2017-10-04 - 2017-10-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2017-10-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Investigation for Improvement of Crystalline Quality of Cr2O3 Thin Film Deposited on Oxide Single Crystal Substrates 
Sub Title (in English)  
Keyword(1) Cr2O3  
Keyword(2) films  
Keyword(3) YAlO3  
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1st Author's Name Tsubasa Enomoto  
1st Author's Affiliation Nihon University (Niti Univ)
2nd Author's Name Sinjirou Hukui  
2nd Author's Affiliation Nihon University (Niti Univ)
3rd Author's Name Tsuyosi Hirato  
3rd Author's Affiliation Nihon University (Niti Univ)
4th Author's Name Takumi Onodera  
4th Author's Affiliation Nihon University (Niti Univ)
5th Author's Name Tomoko Nagata  
5th Author's Affiliation Nihon University (Niti Univ)
6th Author's Name Hirosi Yamamoto  
6th Author's Affiliation Nihon University (Niti Univ)
7th Author's Name Nobuyuki Iwata  
7th Author's Affiliation Nihon University (Niti Univ)
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Speaker Author-1 
Date Time 2017-10-04 14:40:00 
Presentation Time 25 minutes 
Registration for CPM 
Paper # CPM2017-61 
Volume (vol) vol.117 
Number (no) no.224 
Page pp.11-14 
#Pages 4 
Date of Issue 2017-09-27 (CPM) 

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