Paper Abstract and Keywords |
Presentation |
2019-08-23 11:25
Optical deflector parameter measurement method for high precision of optical deflection technology using wavelength swept light source and diffraction grating Masahiro Ueno, Yuichi Akage, Souichi Oka (NTT) R2019-32 EMD2019-30 CPM2019-31 OPE2019-59 LQE2019-37 Link to ES Tech. Rep. Archives: EMD2019-30 CPM2019-31 OPE2019-59 LQE2019-37 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Swept Source type LiDAR, which has vibration resistance due to the lack of mechanical parts, has attracted attention for applications in environments with vibrations such as automobiles and construction sites. In the LiDAR, light beam is deflected by temporally changing the wavelength incident on the diffraction grating. Therefore, when the deflection unit is formed by the space optical system, it is important to accurately obtain the parameters of the light deflector, such as the incident angle of the light to the grating, the angle between the optical axis of the light deflector and the grating, in order to construct a highly accurate LiDAR. As a parameter acquisition method, we propose a method of fitting position data obtained by capturing deflected light by a photodetector to a grating formula. As a result of using the method, both the incident angle to the grating and the installation angle of the grating can be obtained with an accuracy of 0.1degree or less. In addition, it was confirmed that the accuracy of the deflection angle was an accuracy of 0.03degree or less. This is an error level of about 0.5mm at a distance of up to 1m. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
LiDAR / Swept Source / Diffraction Grating / Accuracy / Light Deflector / Incident Angle / Parameter / |
Reference Info. |
IEICE Tech. Rep., vol. 119, no. 171, CPM2019-31, pp. 61-66, Aug. 2019. |
Paper # |
CPM2019-31 |
Date of Issue |
2019-08-15 (R, EMD, CPM, OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
R2019-32 EMD2019-30 CPM2019-31 OPE2019-59 LQE2019-37 Link to ES Tech. Rep. Archives: EMD2019-30 CPM2019-31 OPE2019-59 LQE2019-37 |
Conference Information |
Committee |
LQE OPE CPM EMD R |
Conference Date |
2019-08-22 - 2019-08-23 |
Place (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
CPM |
Conference Code |
2019-08-LQE-OPE-CPM-EMD-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Optical deflector parameter measurement method for high precision of optical deflection technology using wavelength swept light source and diffraction grating |
Sub Title (in English) |
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Keyword(1) |
LiDAR |
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Swept Source |
Keyword(3) |
Diffraction Grating |
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Accuracy |
Keyword(5) |
Light Deflector |
Keyword(6) |
Incident Angle |
Keyword(7) |
Parameter |
Keyword(8) |
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1st Author's Name |
Masahiro Ueno |
1st Author's Affiliation |
Nippon Telegraph and Telephone Corporation (NTT) |
2nd Author's Name |
Yuichi Akage |
2nd Author's Affiliation |
Nippon Telegraph and Telephone Corporation (NTT) |
3rd Author's Name |
Souichi Oka |
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Nippon Telegraph and Telephone Corporation (NTT) |
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Speaker |
Author-1 |
Date Time |
2019-08-23 11:25:00 |
Presentation Time |
25 minutes |
Registration for |
CPM |
Paper # |
R2019-32, EMD2019-30, CPM2019-31, OPE2019-59, LQE2019-37 |
Volume (vol) |
vol.119 |
Number (no) |
no.169(R), no.170(EMD), no.171(CPM), no.172(OPE), no.173(LQE) |
Page |
pp.61-66 |
#Pages |
6 |
Date of Issue |
2019-08-15 (R, EMD, CPM, OPE, LQE) |
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