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Technical Committee on Dependable Computing (DC) (Searched in: 2015)
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Search Results: Keywords 'from:2015-06-16 to:2015-06-16'
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2015-06-16 14:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A test data reduction method based on scan slice on BAST Makoto Nishikiori, Hiroshi Yamazaki, Toshinori Hosokawa, Masayuki Arai (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2015-16 |
BAST is one of techniques to reduce the amount of test data while maintaining high test quality by combining built-in se... [more] |
DC2015-16 pp.1-6 |
DC |
2015-06-16 14:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Study on Fast Bridge Fault Test Generation Based on Critical Area Masayuki Arai (Nihon Univ.), Shingo Inuyama, Kazuhiko Iwasaki (Tokyo Metro. Univ.) DC2015-17 |
[more] |
DC2015-17 pp.7-12 |
DC |
2015-06-16 15:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Method to Identify High Test Power Areas in Layout Design Kohei Miyase (Kyutech), Matthias Sauer, Bernd Becker (Univ. Freiburg), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2015-18 |
The problems related to power consumption during at-speed testing is becoming more serious. Particularly, excessive peak... [more] |
DC2015-18 pp.13-18 |
DC |
2015-06-16 15:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Study on Function Test of Latch-based Asynchronous Pipeline Circuits Daiki Toyoshima, Kyohei Terayama, Atsushi Kurokawa, Masashi Imai (Hirosaki Univ.) DC2015-19 |
Asynchronous MOUSETRAP pipeline circuit is a simple and fast circuit thanks to the 2-phase handshaking protocol which ha... [more] |
DC2015-19 pp.19-24 |
DC |
2015-06-16 16:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Performance Evaluation of Dependability Improvement Methods for Multiple Core Systems based on Markov Models Masashi Imai (Hirosaki Univ.), Tomohiro Yoneda (NII) DC2015-20 |
In embedded systems, multiple core system is a promising architecture not only for performance improvement, but also for... [more] |
DC2015-20 pp.25-30 |
DC |
2015-06-16 16:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Using binary decision diagrams for constraint handling in test case generation Tatsuhiro Tsuchiya (Osaka Univ.) DC2015-21 |
This paper discusses constraint handling in test case generation for Combinatorial Interaction Testing (CIT). CIT requir... [more] |
DC2015-21 pp.31-34 |
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