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| Chair |
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Naoto Kaio (Hiroshima Shudo Univ.) |
| Vice Chair |
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Yasunori Kimura (Fujitsu Labs.) |
| Secretary |
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Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT) |
| Assistant |
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Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy) |
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| Chair |
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Ryo Nagase (Chiba Inst. of Tech.) |
| Vice Chair |
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Kiyoshi Yoshida (Nippon Inst. of Tech.) |
| Secretary |
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Makoto Hasegawa (Chitose Inst. of Science and Tech.), Junya Sekikawa (Shizuoka Univ.) |
| Assistant |
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Yasuhiro Hattori (Sumitomo Denso) |
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| Conference Date |
Fri, Feb 19, 2010 12:35 - 17:00 |
| Topics |
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| Conference Place |
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| Sponsors |
This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Feb 19 PM
12:30 - 17:00 |
| |
12:30-12:35 |
Opening Address ( 5 min. ) |
| (1) |
12:35-13:00 |
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Modeling of the oscillating mechanism (7) --  R2009-50 EMD2009-117 |
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (former Keio Univ/Nippon Inst. of Tech.) |
| (2) |
13:00-13:25 |
A Study on Improvement for Seal property of Electromechanical Devices
-- The behavior of One-Part Epoxy Resin in a narrow gap -- R2009-51 EMD2009-118 |
Osamu Otani, Seiji Nakajima, Tomohiro Fukuhara (OMRON Corp.) |
| (3) |
13:25-13:50 |
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III) R2009-52 EMD2009-119 |
Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.) |
| |
13:50-14:00 |
Break ( 10 min. ) |
| (4) |
14:00-14:25 |
Optical Beam Profiler using Perturbation Interruption Method R2009-53 EMD2009-120 |
Seiichi Onoda, Keiichi Inoue, Koji Aita, Masayuki Nakano (Watanabe Co., Ltd) |
| (5) |
14:25-14:50 |
Accuracy Improvement of BOF/DWPR Temperature Sensing Using a Reference BOF R2009-54 EMD2009-121 |
Yasutoshi Komatsu, Ryuji Nagai, Keiichi Inoue, Seiichi Onoda (Watanabe Co., Ltd) |
| (6) |
14:50-15:15 |
Cut Set Analysis of Fault Tree with Priority AND Gates R2009-55 EMD2009-122 |
Taijirou Yoneda, Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA) |
| |
15:15-15:20 |
Break ( 5 min. ) |
| (7) |
15:20-15:45 |
Observation of wear status of tin plating for automotive connector at initial stage of sliding R2009-56 EMD2009-123 |
Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) |
| (8) |
15:45-16:10 |
Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance R2009-57 EMD2009-124 |
Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) |
| (9) |
16:10-16:35 |
A Study on growth of hair silver R2009-58 EMD2009-125 |
Sadanori Ito (Formerly OMRON), Takahumi Sasaki (OMRON), Hiroki Yamaguchi (OMRON RELAY AND DEVUCE) |
| (10) |
16:35-17:00 |
Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal R2009-59 EMD2009-126 |
Tomoki Yonekawa, Yasushi Saitoh, Kazuo Iida, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech. Ltd) |
| |
17:00-17:05 |
Closing Address ( 5 min. ) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Kimura, Mitsuhiro (Hosei Univ.)
TEL 042-387-6116
FAX 042-387-6126
E- :  m   i |
| EMD |
Technical Committee on Electromechanical Devices (EMD) [Latest Schedule]
|
| Contact Address |
Makoto Hasegawa（Chitose Inst. of Science and Technorogy）
TEL (0123)27-6059、FAX (0123)27-6059
E-:    p n 
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tjkipc  
Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.)
TEL (059)382-8970、FAX (059)382-8591
E-:     -t  sws |
| Announcement |
Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/ |
Last modified: 2009-12-17 09:25:11
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