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| Chair |
|
Masahiko Yoshimoto (Kobe Univ.) |
| Vice Chair |
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Takeshi Yamamura (Fujitsu Labs.) |
| Secretary |
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Hiroaki Suzuki (Renesas), Toshimasa Matsuoka (Osaka Univ.) |
| Assistant |
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Ken Takeuchi (Univ. of Tokyo), Osamu Watanabe (Toshiba), Akira Tsuchiya (Kyoto Univ.) |
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| Conference Date |
Mon, Apr 23, 2012 12:30 - 18:50
Tue, Apr 24, 2012 09:00 - 16:30 |
| Topics |
Memory Device Technologies |
| Conference Place |
|
Contact
Person |
+81-19-629-5553 |
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Mon, Apr 23 PM
12:30 - 18:50 |
| (1) |
12:30-13:20 |
[Invited Talk]
A 19nm 112.8mm2 64Gb Multi-level(2bit/cell) Flash Memory with 400Mb/s/pin 1.8V Toggle Mode Interface  ICD2012-1 |
Noboru Shibata, Kazushige Kanda, Toshiki Hisada, Katsuaki Isobe, Manabu Sato, Yuui Shimizu, Takahiro Shimizu, Takahiro Sugimoto, Tomohiro Kobayashi, Kazuko Inuzuka, Naoaki Kanagawa, Yasuyuki Kajitani, Takeshi Ogawa, Jiyun Nakai (Toshiba), Teruhiko Kamei (SanDisk) |
| (2) |
13:20-14:10 |
[Invited Talk]
128Gb 3-Bit Per Cell NAND Flash Memory on 19nm Technology with 18MB/s Write Rate ICD2012-2 |
Teruhiko Kamei, Yan Li, Seungpil Lee, Ken Oowada, Hao Nguyen, Qui Nguyen, Nima Mokhlesi, Cynthia Hsu, Jason Li, Venky Ramachandra, Masaaki Higashitani, Tuan Pham, Mitsuyuki Watanabe (SanDisk), Mitsuaki Honma, Yoshihisa Watanabe (Toshiba) |
| |
14:10-14:20 |
Break ( 10 min. ) |
| (3) |
14:20-15:10 |
[Invited Talk]
An 8Mb Multi-Layered Cross-Point ReRAM Macro with 443MB/s Write Throughput ICD2012-3 |
Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda, Ken Kawai, Yoshikazu Katoh, Yukio Hayakawa, Kiyotaka Tsuji, Shinichi Yoneda, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono (Panasonic) |
| (4) |
15:10-16:00 |
[Invited Talk]
Dependable SSD design
-- The Issue for Enabling High Capacity Storage Device with Semiconductor -- ICD2012-4 |
Hiroshi Sukegawa (TOSHIBA) |
| (5) |
16:00-16:50 |
[Invited Talk]
Over-10x-Extended-Lifetime 76%-Reduced-Error Solid-State Drives (SSDs) with Error-Prediction LDPC Architecture and Error-Recovery Scheme ICD2012-5 |
Shuhei Tanakamaru, Yuki Yanagihara, Ken Takeuchi (Univ. Tokyo) |
| |
16:50-17:00 |
Break ( 10 min. ) |
| (6) |
17:00-18:50 |
[Panel Discussion]
Thinking of Reconstruction of Japan Semiconductor Indutory in Iwate ICD2012-6 |
Shinji Miyano (STARC), Atsushi Sasaki (Iwate Prefecture), Motoyuki Oishi (Nihon Keizai Shimbun,Inc.), Shoun Matsunaga (Tohoku University), Ken Takeuchi (Chuo Univ.), Hiroshi Sukegawa (Toshiba) |
Tue, Apr 24 AM
09:00 - 16:30 |
| (7) |
09:00-09:50 |
[Invited Talk]
Non-contact High-Speed Data Links for Memory Interfaces ICD2012-7 |
Hiroki Ishikuro, Won-Joo Yun, Shinya Nakano, Wataru Mizuhara, Atsutake Kosuge, Noriyuki Miura, Tadahiro Kuroda (Keio Univ.) |
| (8) |
09:50-10:15 |
4-Times Faster Rising Vpass (10V), 15% Lower Power Vpgm (20V), Wide Output Voltage Range Voltage Generator System for 4-Times Faster 3D-integrated Solid-State Drives ICD2012-8 |
Teruyoshi Hatanaka, Ken Takeuchi (Univ. of Tokyo) |
| |
10:15-10:25 |
Break ( 10 min. ) |
| (9) |
10:25-10:50 |
Design of an MTJ-Based Fully Parallel Nonvolatile TCAM ICD2012-9 |
Shoun Matsunaga, Takahiro Hanyu (Tohoku Univ.) |
| (10) |
10:50-11:15 |
A Non-Volatile Content Addressable Memory Using Three-Terminal Magnetic Domain Wall Motion Cells ICD2012-10 |
Ryusuke Nebashi, Noboru Sakimura, Yukihide Tsuji (NEC), Shunsuke Fukami (Tohoku Univ.), Hiroaki Honjo, Shinsaku Saito, Sadahiko Miura, Nobuyuki Ishiwata (NEC), Keizo Kinoshita, Takahiro Hanyu, Tetsuo Endoh, Naoki Kasai, Hideo Ohno (Tohoku Univ.), Tadahiko Sugibayashi (NEC) |
| (11) |
11:15-12:05 |
[Invited Talk]
Write-/Read- Disturb Issues and Circuit Solutions ICD2012-11 |
Yuichiro Ishii, Yasumasa Tsukamoto, Koji Nii, Hidehiro Fujiwara, Makoto Yabuuchi, Koji Tanaka, Shinji Tanaka, Yasuhisa Shimazaki (Renesas Electronics) |
| |
12:05-13:00 |
Lunch ( 55 min. ) |
| (12) |
13:00-13:50 |
[Invited Talk]
57% Faster Read, 31% Lower Read Energy, 256-Times Faster Injection 6T-SRAM with a Carrier-Injection Scheme to Pinpoint and Repair Disturb Fails ICD2012-12 |
Kousuke Miyaji (Univ. of Tokyo), Toshikazu Suzuki (Panasonic), Shinji Miyano (STARC), Ken Takeuchi (Univ. of Tokyo) |
| (13) |
13:50-14:15 |
0.4V SRAM with Bit Line Swing Suppression Charge Share Hierarchical Bit Line Scheme ICD2012-13 |
Shinichi Moriwaki, Atsushi Kawasumi (STARC), Toshikazu Suzuki (Panasonic), Yasue Yamamoto, Shinji Miyano, Hirofumi Shinohara (STARC), Takayasu Sakurai (Univ. of Tokyo) |
| (14) |
14:15-14:40 |
A 40-nm 0.5-V 12.9-pJ/Access 8T SRAM Using Low-Energy Disturb Mitigation Scheme ICD2012-14 |
Shusuke Yoshimoto, Masaharu Terada, Shunsuke Okumura (Kobe Univ.), Toshikazu Suzuki, Shinji Miyano (STARC), Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) |
| |
14:40-14:50 |
Break ( 10 min. ) |
| (15) |
14:50-15:15 |
Device-Conscious Circuit Designs for 0.5-V High-Speed Nanoscale CMOS LSIs ICD2012-15 |
Akira Kotabe, Kiyoo Itoh, Riichiro Takemura, Ryuta Tsuchiya (Hitachi), Masashi Horiguchi (Renesas) |
| (16) |
15:15-15:40 |
Low-Energy Block-Level Instantaneous Comparison 7T SRAM for Dual Modular Redundancy ICD2012-16 |
Yohei Umeki, Shunsuke Okumura, Yohei Nakata, Koji Yanagida, Yuki Kagiyama, Shusuke Yoshimoto, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST) |
| (17) |
15:40-16:05 |
A Chip-ID Generating Circuit for Dependable LSI using Random Address Errors on Embedded SRAM and On-Chip Memory BIST ICD2012-17 |
Hidehiro Fujiwara, Makoto Yabuuchi, Hirofumi Nakano, Hiroyuki Kawai, Koji Nii, Kazutami Arimoto (Renesas Electronics) |
| (18) |
16:05-16:30 |
A 128-bit Chip Identification Generating Scheme Exploiting SRAM Bitcells with Failure Rate of 4.45X 10-19 ICD2012-18 |
Shunsuke Okumura, Shusuke Yoshimoto, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ., JST CREST) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| ICD |
Technical Committee on Integrated Circuits and Devices (ICD) [Latest Schedule]
|
| Contact Address |
Ken Takeuchi (The University of Tokyo)
TEL＆FAX 03-5841-6687
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Last modified: 2012-02-17 12:36:27
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