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Technical Group on Information Sensing Technologies (ITE-IST) [schedule] [select]
Chair Masayuki Ikebe (Hokkaido Univ.)
Vice Chair Takashi Komuro (Saitama Univ.), Kazuhiro Shimonomura (Ritsmeikan Univ.), Keiichiro Kagawa (Shizuoka Univ.)
Secretary Takashi Tokuda (Tokyo Inst. of Tech.), Rihito Kuroda (Tohoku Univ.), Kazuya Kitamura (NHK), Yuichiro Yamashita (TSMC), Shunsuke Okura (Ritsumeikan Univ.), Yoshiaki Takemoto (MEMS CORE)
Assistant Junichi Akita (Kanazawa Univ.)

Technical Committee on Silicon Device and Materials (SDM) [schedule] [select]
Chair Shunichiro Ohmi (Tokyo Inst. of Tech.)
Vice Chair Tatsuya Usami (Rapidus)
Secretary Tomoyuki Suwa (Tohoku Univ.), Taiji Noda (Panasonic)
Assistant Takuji Hosoi (Kwansei Gakuin Univ.), Takuya Futase (Western Digital)

Technical Committee on Integrated Circuits and Devices (ICD) [schedule] [select]
Chair Makoto Ikeda (Univ. of Tokyo)
Vice Chair Hayato Wakabayashi (Sony Semiconductor Solutions)
Secretary Yoshiaki Yoshihara (Kioxia), Kosuke Miyaji (Shinshu Univ.)
Assistant Ryo Shirai (Kyoto Univ.), Jun Shiomi (Osaka Univ.), Takeshi Kuboki (Sony Semiconductor Solutions)

Conference Date Tue, Aug 1, 2023 10:00 - 17:00
Wed, Aug 2, 2023 09:00 - 17:00
Thu, Aug 3, 2023 09:30 - 15:30
Topics Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Conference Place Hokkaido Univ. Multimedia Education Bldg. 3F 
Address Kita 16, Nishi 8, Kita-ku, Sapporo, Hokkaido, Japan
Transportation Guide https://www.imc.hokudai.ac.jp/event/event/%E6%83%85%E5%A0%B1%E6%95%99%E8%82%B2%E9%A4%A8%E4%BD%8D%E7%BD%AE%E5%9B%B3.pdf
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on SDM, ICD.

Tue, Aug 1 AM 
10:00 - 13:00
(1)
ICD
10:00-10:45 [Invited Talk]
Development of small-size high-resolution cyclic ADC with latest CMOS technology SDM2023-35 ICD2023-14
Takashi Oshima, Keisuke Yamamoto, Goichi Ono (Hitachi)
(2)
ICD
10:45-11:10 A research on a cryogenic ADC for acquisition of environmental noise near quantum devices. SDM2023-36 ICD2023-15 Tomoya Yamada, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.)
(3)
ICD
11:10-11:35 Evaluation on Flip-Chip Packaging for Quantum Computers at Cryogenic Temperature SDM2023-37 ICD2023-16 Misato Taguchi, Ryozo Takahashi (Kobe Univ.), Masako Kato, Nobuhiro Kusuno (Hitachi, Ltd), Takuji Miki, Makoto Nagata (Kobe Univ.)
(4)
ITE-IST
11:35-12:00 Linearity improvement of VCO based ADC with low power suplly voltage via complimentary bias voltage control Takuto Togashi, Yoshihiro Komatsu, Masayuki Ikebe (Hokkaido Univ.)
  12:00-13:00 Lunch Break ( 60 min. )
Tue, Aug 1 PM 
13:00 - 17:00
(5)
ICD
13:00-13:45 [Invited Talk]
R and D of Low Power Semiconductor Technology and It's Application Expansions
-- Review R and D of Semiconductor device and LSI for these 43 years --
SDM2023-38 ICD2023-17
Koichiro Ishibashi (UEC)
(6)
ICD
13:45-14:30 [Invited Talk]
Research Trends in Low Power Sensors and Wireless Technology SDM2023-39 ICD2023-18
Shiro Dosho, Noboru Ishihara, Hiroyuki Ito (TIT)
(7)
ITE-IST
14:30-15:15 [Invited Talk]
Edge AI: Now and Future
Masato Motomura (Tokyo Tech)
  15:15-15:25 Break ( 10 min. )
(8)
SDM
15:25-16:10 [Invited Talk]
Low-Frequency Noise Source in the Cryogenic Operation of Short-Channel Bulk MOSFET SDM2023-40 ICD2023-19
Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST)
(9)
SDM
16:10-16:35 Additional High-Pressure Hydrogen Annealing Improves the Cryogenic Operation of Si (110)-oriented n-MOSFETs SDM2023-41 ICD2023-20 Shunsuke Shitakata (Keio Univ./AIST), Hiroshi Oka, Takumi Inaba, Shota Iizuka, Kimihiko Kato, Takahiro Mori (AIST)
(10)
SDM
16:35-17:00 Analysis of back bias effects and history phenomena in cryo 200nm SOIMOSFETs SDM2023-42 ICD2023-21 Ryusei Ri, Takayuki Mori (KIT), Hiroshi Oka, Takahiro Mori (AIST), Jiro Ida (KIT)
Wed, Aug 2 AM 
09:00 - 13:15
(11)
ICD
09:00-09:45 [Invited Talk]
A 33kDMIPS 6.4W Vehicle Communication Gateway Processor Achieving 10Gbps/W Network Routing, 40ms CAN Bus Start-Up and 1.4mW Standby SDM2023-43 ICD2023-22
Kenichi Shimada, Keiichiro Sano, Kazuki Fukuoka, Hiroshi Morita, Masayuki Daito, Tatsuya Kamei, Hiroyuki Hamasaki, Yasuhisa Shimazaki (Renesas)
(12)
ICD
09:45-10:10 A 1W/8R 20T SRAM Codebook for Deep Learning Processors to Reduce Main Memory Bandwidth SDM2023-44 ICD2023-23 Ryotaro Ohara, Masaya Kabuto, Masakazu Taichi, Atsushi Fukunaga, Yuto Yasuda, Riku Hamabe, Shintaro Izumi, Hiroshi Kawaguchi (Kobe Univ)
(13)
ITE-IST
10:10-10:35 A Small-Area and Highly-Linear Column Readout Circuit for LOFIC CMOS Image Sensor Ryotaro Hotta, Shunsuke Okura, Ai Otani, Kazuki Tatsuta (Ritsmeikan), Ken Miyauchi, Han Sangman, Hideki Owada, Isao Takayanagi (Brillnics)
  10:35-10:45 Break ( 10 min. )
(14)
ITE-IST
10:45-11:30 [Invited Talk]
The Image Sensor Technology: Building the Foundation for Information Sensing Societies
Hayato Wakabayashi (Sony Semiconductor Solutions)
(15)
ITE-IST
11:30-12:15 [Invited Talk]
Multimodal flexible sensor system
Kuniharu Takei (Hokkaido Univ.)
  12:15-13:15 Lunch Break ( 60 min. )
Wed, Aug 2 PM 
13:15 - 17:00
(16)
SDM
13:15-14:00 [Invited Talk]
A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel and InSnOx Electrode for 3D Integrated Devices SDM2023-45 ICD2023-24
Masaharu Kobayashi, Kaito Hikake, Zhuo Li, Junxiang Hao, Chitra Pandy, Takuya Saraya, Toshiro Hiramoto (Univ. Tokyo), Takanori Takahashi, Mutsunori Uenuma, Yukiharu Uraoka (NAIST)
(17)
SDM
14:00-14:45 [Invited Talk]
Technology Trends in CMOS Devices for Advanced Logic LSIs
-- FinFET, BS-PDN, GAA-NS-FET, CFET, 2D-CFET --
SDM2023-46 ICD2023-25
Hitoshi Wakabayashi (Tokyo Tech)
(18)
SDM
14:45-15:10 Multi-Output MOSFET for Standard Sensor/Circuit Design Platform Device SDM2023-47 ICD2023-26 Tomochika Harada (Yamagata University)
  15:10-15:20 Break ( 10 min. )
(19) 15:20-17:00  
Thu, Aug 3 AM 
09:30 - 13:00
(20)
SDM
09:30-10:15 [Invited Talk]
Current issue & development prospects for 2D layered material devices SDM2023-48 ICD2023-27
Kosuke Nagashio (UTokyo)
(21)
SDM
10:15-11:00 [Invited Talk]
Demonstration of Recovery Annealing on 7-Bits per Cell 3D Flash Memory at Cryogenic Operation for Bit Cost Scalability and Sustainability SDM2023-49 ICD2023-28
Yuta Aiba, Hitomi Tanaka, Fumie Kikushima, Hiroki Tanaka, Toshio Fujisawa, Hideko Mukaida, Tomoya Sanuki (KIOXIA)
  11:00-11:10 Break ( 10 min. )
(22)
ITE-IST
11:10-11:35 Stabilizing Variable Filters Using Inverse Trigonometric Functions Tian-Bo Deng (Toho Univ.)
(23)
ITE-IST
11:35-12:00 A method for analyzing chlorophyll-a concentration in the seawater surface layer by image hue analysis. Shunya Kosako, Toshihiko Hamasaki (HIT)
  12:00-13:00 Break ( 60 min. )
Thu, Aug 3 PM 
13:00 - 15:30
(24)
ICD
13:00-13:45 [Invited Talk]
Energy Field, Computer Shape SDM2023-50 ICD2023-29
Noriyuki Miura (Osaka Univ.)
(25)
ICD
13:45-14:30 [Invited Talk]
Load Adaptive Active Gate Driver Integrated Circuit for Power Device SDM2023-51 ICD2023-30
Shusuke Kawai, Takeshi Ueno, Satoshi Takaya, Koutaro Miyazaki (Toshiba), Kohei Onizuka (Toshiba Europe Limited), Hiroaki Ishihara (Toshiba)
  14:30-14:40 Break ( 10 min. )
(26)
ICD
14:40-15:05 Real-Time Gate Current Change Gate Driver IC to Adapt to Operating Condition Variations of SiC MOSFETs SDM2023-52 ICD2023-31 Dibo Zhang, Kohei Horii, Katsuhiro Hata, Makoto Takamiya (UTokyo)
(27)
ICD
15:05-15:30 Gate Driver IC with Fully Integrated Overcurrent Protection Function by Measuring Gate-to-Emitter Voltage SDM2023-53 ICD2023-32 Haifeng Zhang, Dibo Zhang, Hiromu Yamasaki, Katsuhiro Hata (Univ. of Tokyo), Keiji Wada (Tokyo Metropolitan Univ.), Kan Akatsu (Yokohama National Univ.), Ichiro Omura (Kyusyu Institute of Technology), Makoto Takamiya (Univ. of Tokyo)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.
Invited TalkEach speech will have 40 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
ITE-IST Technical Group on Information Sensing Technologies (ITE-IST)   [Latest Schedule]
Contact Address Masayuki Ikebe (Hokkaido university)
E--mail: ibeisti 
SDM Technical Committee on Silicon Device and Materials (SDM)   [Latest Schedule]
Contact Address Kiwamu SAKUMA (KIOXIA Corporation)
E--mail: oxia 
ICD Technical Committee on Integrated Circuits and Devices (ICD)   [Latest Schedule]
Contact Address Kousuke Miyaji (Shinshu university)
E--mail: knshu-u 


Last modified: 2023-07-26 13:42:30


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