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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ED 2013-02-27
14:10		 Hokkaido Hokkaido Univ. Variation of Seebeck coefficient of Si-on-insulator layer induced by bias-injected carriers
Hiroya Ikeda, Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./Research Fellow of JSPS) ED2012-129 SDM2012-158		 The enhancement of Seebeck coefficient by controlling the Si Fermi energy is one of key issues for enhancing the thermoe... [more] ED2012-129 SDM2012-158
pp.7-11
ED, SDM 2012-02-08
11:00		 Hokkaido   Seebeck Coefficient of Ultrathin Si with Fermi Energy Controlled by External Bias
Faiz Salleh, Kazutoshi Miwa, Hiroya Ikeda (Shizuoka Univ.) ED2011-153 SDM2011-170		 We varied the Seebeck coefficient of an n-type silicon-on-insulator (SOI) sample by applying an external bias in order t... [more] ED2011-153 SDM2011-170
pp.65-69
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