|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SS, KBSE, IPSJ-SE [detail] |
2023-07-22 09:55 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Exploring the Magnetic or Sticky Nature of GitHub Ecosystems: NPM, PyPI, and Rubygems Shurong Sun, Olivier Nourry, Dong Wang, Yasutaka Kamei (Kyushu Univ.) SS2023-17 KBSE2023-28 |
Software ecosystems consist of a number of software projects that are developed and evolve within a shared environment. ... [more] |
SS2023-17 KBSE2023-28 pp.92-97 |
VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 09:55 |
Online |
Online |
Efficient computation of inductive invariant through flipflop selection Fudong Wang, Masahiro Fujita (U-Tokyo) VLD2020-20 ICD2020-40 DC2020-40 RECONF2020-39 |
As we all know, verification plays more and more important role in VLSI design and manufacture. However, it always takes... [more] |
VLD2020-20 ICD2020-40 DC2020-40 RECONF2020-39 pp.54-59 |
TL |
2019-03-18 11:45 |
Tokyo |
Waseda University |
What Makes Students Aware of the Significance of Logical Expression
-- Teaching Design and Analysis of Students Learning -- Dong Wang (TUFS) TL2018-58 |
(To be available after the conference date) [more] |
TL2018-58 pp.43-46 |
TL |
2018-12-09 15:30 |
Ehime |
Ehime University |
The reexamination of the nature of 'hayaku' : Be Means of Chinese Translation Dong Wang (TUFS) TL2018-49 |
[more] |
TL2018-49 pp.29-31 |
SDM |
2015-06-19 13:40 |
Aichi |
VBL, Nagoya Univ. |
Fabrication of PtGe/Ge contacts with low hole barrier and its application to metal source/drain Ge p-channel MOSFETs Yuta Nagatomi, Shintaro Tanaka, Yuichi Nagaoka, Keisuke Yamamoto, Dong Wang, Hiroshi Nakashima (Kyushu Univ.) SDM2015-47 |
The fabrication of PtGe/Ge contacts with low hole barrier height (ΦBP) and its electrical passivation were investigated.... [more] |
SDM2015-47 pp.47-50 |
SDM |
2014-06-19 09:50 |
Aichi |
VBL, Nagoya Univ. |
Investigation of Al-PMA Effect on Al2O3/GeOx/Ge Gate Stack Yuta Nagatomi, Yuichi Nagaoka, Keisuke Yamamoto, Dong Wang, Hiroshi Nakashima (Kyushu Univ.) SDM2014-44 |
We investigated the Al-PMA effect on Al2O3/GeOX/Ge gate stacks. The Al-PMA is effective for Al2O3/GeOX/Ge gate stacks, s... [more] |
SDM2014-44 pp.7-10 |
SDM |
2013-06-18 10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Mobility Enhancement for Ge p-MOSFET with Metal Source/Drain by Hf Introduction into Gate Stack Keisuke Yamamoto, Takahiro Sada, Dong Wang, Hiroshi Nakashima (Kyushu Univ.) SDM2013-49 |
Metal source/drain (S/D) with extremely low parasitic resistance is needed for high performance Ge CMOS. We found that H... [more] |
SDM2013-49 pp.29-32 |
SDM |
2012-06-21 17:15 |
Aichi |
VBL, Nagoya Univ. |
Alleviation of Fermi level pinning for TiN/Ge contact and its application to MOS device Keisuke Yamamoto, Masatoshi Iyota, Dong Wang, Hiroshi Nakashima (Kyushu Univ.) SDM2012-61 |
It has been recognized that the formation of a metal/Ge contact with low electron barrier height and low contact resista... [more] |
SDM2012-61 pp.97-102 |
SDM |
2009-06-19 14:10 |
Tokyo |
An401・402 Inst. Indus. Sci., The Univ. of Tokyo |
Electrical Characterization of High-k Gate Dielectrics on Ge with HfGeN and GeO2 Interlayers
-- Formation of Insulator on Ge Substrate -- Hiroshi Nakashima, Kana Hirayama, Haigui Yang, Dong Wang (Kyushu Univ.) SDM2009-35 |
We are searching MIS structure with good interface and insulating properties for high mobility Ge channel. Our approach... [more] |
SDM2009-35 pp.51-56 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|