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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2023-03-03
13:45		 Saitama NIT and Online
(Primary: On-site, Secondary: Online)		 Research on mechanism for bathing assistance for disabilities
Hirokazu Saito, Ryo Nagase (CIT) EMD2022-23		 The purpose of this study was to develop an arm-supporting mechanism that enables a patient with physical disabilities t... [more] EMD2022-23
pp.15-18
OCS, OFT, OPE
(Joint) [detail]		 2023-02-17
09:40		 Okinawa kukuru-itomancity
(Primary: On-site, Secondary: Online)		 A study on attenuation of coupled 4-core MCF
Kiyoshi Kamimura, Yuki Fujimaki, Hirokazu Saito, Yuya Mori, Ryo Nagase (CIT) OFT2022-59 OPE2022-107		 A transmission system using coupled multicore fiber (MCF) has been proposed as one of the candidates for future large-ca... [more] OFT2022-59 OPE2022-107
pp.41-44(OFT), pp.68-71(OPE)
SDM 2018-10-17
14:00		 Miyagi Niche, Tohoku Univ. [Invited Talk] Fin-FET MONOS for Next Generation Automotive-MCU
Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Yasuo Yamaguchi, Tomohiro Yamashita (Renesas) SDM2018-52		  [more] SDM2018-52
pp.1-5
SDM 2018-01-30
14:00		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Reliability and Scalability of FinFET Split-Gate MONOS Array with Tight Vth Distribution for 16/14nm-node Embedded Flash
Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Tomohiro Yamashita, Yasuo Yamaguchi (renesas) SDM2017-94		 Reliability and scalability of split-gate metal-oxide nitride oxide silicon (SG-MONOS) are discussed for 16/14nm-node em... [more] SDM2017-94
pp.13-16
 Results 1 - 4 of 4  /   
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