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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2016-06-20 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Binding Method for Testability to Generate Easily Testable Functional Time Expansion Models Mamoru Sato, Toshinori hosokawa, Tetsuya Masuda, Jun Nishimaki (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2016-14 |
A test generation method for datapaths using easily testable functional time expansion models was proposed as efficient ... [more] |
DC2016-14 pp.25-30 |
DC |
2015-02-13 11:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Test Method for Encryption LSI against Scan-based Attacks Masayoshi Yoshimura (Kyoto Sangyo Univ.), Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.) DC2014-82 |
[more] |
DC2014-82 pp.25-30 |
DC |
2015-02-13 14:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
A Method of Scheduling in High-Level Synthesis for Hierarchical Testability Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2014-84 |
We previously proposed a binding method for hierarchical testability to increase the number of hierarchically testable f... [more] |
DC2014-84 pp.37-42 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-28 10:30 |
Oita |
B-ConPlaza |
A Multi Cycle Capture Test Generation Method to Reduce Capture Power Dissipation Hiroshi Yamazaki, Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) VLD2014-100 DC2014-54 |
[more] |
VLD2014-100 DC2014-54 pp.191-196 |
DC |
2014-06-20 16:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Binding Method for Hierarchical Testability Using Results of Test Environment Generation Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2014-16 |
Hierarchical test generation methods using functional register-transfer level circuits have been proposed as efficient t... [more] |
DC2014-16 pp.39-44 |
DC |
2014-06-20 16:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An evaluation for Testability of Functional k-Time Expansion Models Tetsuya Masuda, Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2014-17 |
A test generation method using functional k-time expansion models for data paths was proposed. In the test generation
m... [more] |
DC2014-17 pp.45-50 |
DC |
2014-02-10 16:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Low Power Consumption Oriented Test Generation Method for Transition Faults Using Multi Cycle Capture Test Generation Hiroshi Yamazaki, Yuto Kawatsure, Jun Nishimaki, Atsushi Hirai, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ), Koji Yamazaki (Meiji Univ) DC2013-89 |
High power dissipation can occur when the response to a test pattern is captured by flip-flops in at-speed scan testing,... [more] |
DC2013-89 pp.61-66 |
DC |
2013-06-21 13:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Controller Augmentation Method to Generate Functional k-Time Expansion Models for Data Path Circuits Yusuke Kodama, Jun Nishimaki, Tetsuya Masuda, Toshinori Hosokawa (Nihon Univ), Hideo Fujiwara (Osaka Gakuin Univ) DC2013-10 |
In recent years, various high-level test synthesis methods for LSIs have been proposed for the improvement in design pro... [more] |
DC2013-10 pp.1-6 |
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