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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2023-02-28 11:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.) DC2022-83 |
(To be available after the conference date) [more] |
DC2022-83 pp.6-11 |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2022-11-29 09:15 |
Kumamoto |
(Primary: On-site, Secondary: Online) |
A Don't Care Filling Method of control signals for controllers to Maximize the Number of Distinguishable Hard ware Element Pairs Yui Otsuka, Yuya Chida, Xu Haofeng, Toshinori Hosokawa (Nihon Univ.), Kouji Yamazaki (Meiji Univ.) VLD2022-25 ICD2022-42 DC2022-41 RECONF2022-48 |
[more] |
VLD2022-25 ICD2022-42 DC2022-41 RECONF2022-48 pp.37-42 |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2022-11-29 09:40 |
Kumamoto |
(Primary: On-site, Secondary: Online) |
A Test Generation Merhod Based on Design for Diagnosability at RTL Yuya Chida, Toshinori Hosokawa (Nihon univ.), Koji Yamazaki (Meiji Univ.) VLD2022-26 ICD2022-43 DC2022-42 RECONF2022-49 |
(To be available after the conference date) [more] |
VLD2022-26 ICD2022-43 DC2022-42 RECONF2022-49 pp.43-48 |
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] |
2022-03-10 10:50 |
Online |
Online |
A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage Yuya Chida, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) CPSY2021-57 DC2021-91 |
As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been propose... [more] |
CPSY2021-57 DC2021-91 pp.73-78 |
DC |
2022-03-01 15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Evaluation of Don't Care Filling Method of Control Signals to Enhance Fault Diagnosability for Logic and Timing Fault Kohei Tsuchibuchi, Xu Haofeng, Yuya Chida, Toshinori Hosokawa (Nihon Univ), Koji Yamazaki (Meiji Univ) DC2021-76 |
[more] |
DC2021-76 pp.69-74 |
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