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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
OPE, EMT, LQE, PN, IEE-EMT |
2010-01-29 14:25 |
Kyoto |
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Aluminum surface plasmon color filter Naoki Ikeda, Daiju Tsuya, Yoshimasa Sugimoto, Yasuo Koide (National Inst. for Materials Science), Atsushi Miura, Daisuke Inoue, Tsuyoshi Nomura, Hisayoshi Fujikawa, Kazuo Sato (Toyota CRDL) PN2009-59 OPE2009-197 LQE2009-179 |
In order to realize surface plasmon color filter we fabricated precise hole array which lattice constant of 300~400nm us... [more] |
PN2009-59 OPE2009-197 LQE2009-179 pp.129-132 |
SDM |
2009-11-13 15:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Atomic Scale Analysis of the Degradation Mechanism of the Integrity High-k/Metal-gate Interface Caused by the Interaction between Point-Defects and Residual Strain around the Interface Ken Suzuki, Yuta Itoh, Tatsuya Inoue, Hideo Miura (Tohoku Univ.), Hideki Yoshikawa, Keisuke Kobayashi (National Inst. for Materials Science), Seiji Samukawa (Tohoku Univ.) SDM2009-149 |
Control of the interfacial crystallographic structure between a dielectric film and a gate electrode is one of the most ... [more] |
SDM2009-149 pp.79-84 |
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