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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2018-10-17 15:20 |
Miyagi |
Niche, Tohoku Univ. |
Low-Temperature Formation of Ohmic Contact for Si TFT Fabrication by Excimer Laser Doping with Phosphoric Acid Coating Kaname Imokawa (Kyushu Univ), Nozomu Tanaka (Kyushu Univ.), Akira Suwa (Kyushu Univ), Daisuke Nakamura, Taizoh Sadoh (Kyushu Univ.), Tetsuya Goto (New Industry Creation Hatchery Center, Tohoku Univ.), Hiroshi Ikenoue (Kyushu Univ) SDM2018-54 |
There are some issues in printable Si TFT processes. In particlular, formation of ormic contact of silicon TFT requiers ... [more] |
SDM2018-54 pp.11-14 |
SDM, OME |
2016-04-08 16:50 |
Okinawa |
Okinawa Prefectural Museum & Art Museum |
Multi-shots ELA of sputtered Si film and TFT with metal source-drain structure Taisei Harada, Futa Gakiya, Takuya Ashitomi, Tatsuya Okada, Takashi Noguchi (Univ. of the Ryukyus), Kanji Noda, Akira Suwa (GiGAPHOTON Inc.), Hiroshi Ikenoue (Kyusyu Univ.), Tetsuo Okuyama (TOYOBO Company, Limited) SDM2016-10 OME2016-10 |
[more] |
SDM2016-10 OME2016-10 pp.39-41 |
ED |
2006-12-08 13:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Fabrication of hot electron transistor controlled by insulation gate Akira Suwa, Takashi Hasegawa, Takahiro Hino, Yasuyuki Miyamoto, Kazuhito Furuya (Tokyo Tech) |
[more] |
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ED, MW |
2006-01-18 15:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Increase of colllector current in hot eletron transistors controlled by gate bias Issei Kashima, Akira Suwa (Tokyo Tech), Yasuyuki Miyamoto, Kazuhito Furuya (Tokyo Tech JST-CREST) |
[more] |
ED2005-196 MW2005-150 pp.23-28 |
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