IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
LOIS, ICM 2024-01-25
15:15
Nagasaki Nagasaki Prefectural Art Museum
(Primary: On-site, Secondary: Online)
Considerations of Improving Worker Response Quality in Crowd Sourcing
Honoka Tanitsu, Tatsuki Tamano, Ryuya Itano, Takahiro Koita (Doshisha Univ.) ICM2023-30 LOIS2023-34
In recent years, affordable high-performance surveillance cameras have become widespread in retail stores and households... [more] ICM2023-30 LOIS2023-34
pp.12-16
R 2022-11-17
15:25
Online Online Process capability index for reliability evaluation
Toshinari Mastsuoka (MELCO) R2022-43
Optimize the tolerance limits of the process capability index to obtain the reliability to achieve the target quality. [more] R2022-43
pp.17-22
SITE, IPSJ-EIP 2013-05-16
11:25
Kanagawa Institute of Infomation Security Proposal of SNS Membership Qualification System Using Security Information Database
Yasuyoshi Okada, Kazuyuki Ishii, Naoshi Sato (Institute of Information Security) SITE2013-3
In order to assure information security of Social Networking Service (SNS), this paper proposes to introduce a membershi... [more] SITE2013-3
pp.11-16
EMD, R 2011-02-18
15:50
Shizuoka Shizuoka Univ. (Hamamatsu) Statistical Quality Control based on Early Life Failure Rate for Electronic Components
Toshinari Matsuoka (MELCO) R2010-48 EMD2010-149
Basically, a manufacturing process of electronic components is complex and demanding.Therefore, in order to achieve a qu... [more] R2010-48 EMD2010-149
pp.37-42
EMD, R 2009-02-20
13:45
Mie Sumitomo Wiring Systems LTD., Head Office Pull strength analysis of Pb free solder at a connected point
Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.) R2008-51 EMD2008-127
Pull strength of Pb free solder at a connected point is tested and analyzed.
Experiments are performed with various p... [more]
R2008-51 EMD2008-127
pp.43-48
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan