IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2008-04-18 / Issue Date : 2008-04-11

EMD2008-1
Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism --
Shin-ichi Wada, Keiji Koshida, Hiroto Minegishi, Hiroshi Amao, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.)
pp. 1 - 6

EMD2008-2
Singularity of Contact Resistance Chracteristics for Tin Contacts
Terutaka Tamai, Katsunori Hotta, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech.)
pp. 7 - 12

EMD2008-3
Electrodeposition of Organic Dielectric Film on MEMS Devices for improvement of Reliability
Tomomi Sakata, Kei Kuwabara, Norio Sato, Toshishige Shimamura, Hiromu Ishii (NTT), Kazuhisa Kudou, Katsuyuki Machida (NTT-AT)
pp. 13 - 16

EMD2008-4
A study on contact spots of the relays used for earthquake disasters by Surface Potential Microscopy
Yoshitada Watanabe, Yuichi Hirakawa (Kogakuin Univ.)
pp. 17 - 22

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan