Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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EMD2009-117
Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Modeling of the oscillating mechanism (7) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (former Keio Univ/Nippon Inst. of Tech.)
pp. 1 - 6
EMD2009-118
A Study on Improvement for Seal property of Electromechanical Devices
-- The behavior of One-Part Epoxy Resin in a narrow gap --
Osamu Otani, Seiji Nakajima, Tomohiro Fukuhara (OMRON Corp.)
pp. 7 - 11
EMD2009-119
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III)
Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.)
pp. 13 - 18
EMD2009-120
Optical Beam Profiler using Perturbation Interruption Method
Seiichi Onoda, Keiichi Inoue, Koji Aita, Masayuki Nakano (Watanabe Co., Ltd)
pp. 19 - 24
EMD2009-121
Accuracy Improvement of BOF/DWPR Temperature Sensing Using a Reference BOF
Yasutoshi Komatsu, Ryuji Nagai, Keiichi Inoue, Seiichi Onoda (Watanabe Co., Ltd)
pp. 25 - 30
EMD2009-122
Cut Set Analysis of Fault Tree with Priority AND Gates
Taijirou Yoneda, Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA)
pp. 31 - 36
EMD2009-123
Observation of wear status of tin plating for automotive connector at initial stage of sliding
Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.)
pp. 37 - 42
EMD2009-124
Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance
Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.)
pp. 43 - 48
EMD2009-125
A Study on growth of hair silver
Sadanori Ito (Formerly OMRON), Takahumi Sasaki (OMRON), Hiroki Yamaguchi (OMRON RELAY AND DEVUCE)
pp. 49 - 52
EMD2009-126
Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal
Tomoki Yonekawa, Yasushi Saitoh, Kazuo Iida, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech. Ltd)
pp. 53 - 57
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.