IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2012-07-20 / Issue Date : 2012-07-13

EMD2012-16
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism (23) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Kouki Takeda, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
pp. 1 - 6

EMD2012-17
Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (24) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
pp. 7 - 12

EMD2012-18
Magnetically Blowing out of Break Arcs Restricted by the Wall
Hitoshi Ono, Junya Sekikawa (Shizuoka Univ)
pp. 13 - 18

EMD2012-19
Electric-Resistance Measurement of Magnetic Pulse Welding Samples
Eiki Kabasawa, Keigo Okagawa, Masaki Ishibashi, Tomokatsu Aizawa (TMCIT)
pp. 19 - 24

EMD2012-20
Parallel Seam Welding of Aluminum and Copper Sheets for Electro-Conductive Connection by Magnetic Pulse Welding Method
Tomokatsu Aizawa, Kazuo Matsuzawa, Keigo Okagawa (Tokyo Metropolitan College)
pp. 25 - 30

EMD2012-21
Bore Sighting Method and Its Simplification for Radiated Emission Measurement above 1 GHz Band
Ikuya Minematsu (KEC), Tatsurou Horiuchi (Roland), Hiroshi Kitada (MURATA), Masaru Yoshiwara (RIKEN), Yukio Kajita (KITAGAWA INDUSTRIES), Tetsuya Nakamura (TOYO), Osami Wada (Kyoto), Hisashi Ninomiya (Roland)
pp. 31 - 36

EMD2012-22
Study of correlation between kit-module level and electric field strength by using SO-DIMM evaluation model
Nobuo Kuwabara (KIT), Hirokazu Tohya (ICAST), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA DEVIC), Toshiki Shimasaki (NEC Engineering)
pp. 37 - 42

EMD2012-23
Energy-based analysis of electrostatic discharge current -- Assessment of high oscillations in ESD waveform --
Masao Masugi (Ritsumeikan Univ.), Norihito Hirasawa, Yoshiharu Akiyama (NTT), Kazuo Murakawa (NTT east)
pp. 43 - 46

EMD2012-24
SAR Evaluation of Capsule Endoscope with Spatial Diversity Reception
Daisuke Anzai, Sho Aoyama, Masafumi Yamanaka, Jianqing Wang (Nagoya Inst. of Tech.)
pp. 47 - 52

EMD2012-25
[Special Talk] Study on Exposure System for Biological Effect Test of Radio Wave
Jianqing Wang (Nagoya Inst. of Tech.)
pp. 53 - 56

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan