Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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EMCJ2013-1
Redection in common-mode radiation and maintenance of signal integrity by adding guard trace with periodic structure
Yuho Terai, Yoshitaka Toyota, Kengo Iokibe (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture)
pp. 1 - 6
EMCJ2013-2
Quantitative estimation of total EMI radiation with normal-mode and common-mode antenna models
Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture), Yuri Wakaduki, Yoshitaka Toyota, Kengo Iokibe (Okayama Univ.)
pp. 7 - 12
EMCJ2013-3
Low Power CSSAL Bit-Parallel Multiplier over GF(2^4) in 0.18 um CMOS Technology
Cancio Monteiro, Yasuhiro Takahashi, Toshikazu Sekine (Gifu Univ.)
pp. 13 - 18
EMCJ2013-4
Improvement of Reproducibility of DPI Method to Quantify RF Conducted Immunity of Voltage Regulator
Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.)
pp. 19 - 24
EMCJ2013-5
Noise Investigation of Cryptographic ICs for Side-Channel Analysis by Means of Equivalent Current Source Model
-- A Study with SASEBO-G --
Kengo Iokibe, Tetsuo Amano, Yoshitaka Toyota (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture)
pp. 25 - 30
EMCJ2013-6
Influence of radio wave absorber performance to test result deviation between full anechoic room and semi-anechoic room.
Keita Nagaoka, Nobuo Kuwabara (Kyushu Inst. of Tech.), Hidenori Muramatsu, Toshiki Shimasaki (VCCI)
pp. 31 - 36
EMCJ2013-7
Measurement Method for Permittivity and Permeability of Artificially-designed Sheet
Shinichiro Yamamoto, Kenichi Hatakeyama (Univ. of Hyogo), Takanori Tsutaoka (Hiroshima Univ.)
pp. 37 - 42
EMCJ2013-8
Fundamental Study on Visualization of Intentional Electromagnetic Interference Fault Injection on Cryptographic Device
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.)
pp. 43 - 47
EMCJ2013-9
[Special Talk]
Trend for Standardization of electromagnetic security
Tetsuya Tominaga (NTT west)
pp. 49 - 54
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.