IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 114, Number 96

Organic Molecular Electronics

Workshop Date : 2014-06-20 / Issue Date : 2014-06-13

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Table of contents

OME2014-16
Improved energy transfer from semiconductor quantum dot to organic dye using column separation technique
Tomokazu Kurabayashi, Nayuta Funaki, Takeshi Fukuda, Zentaro Honda, Norihiko Kamata, Miho Suzuki (Saitama Univ.)
pp. 1 - 4

OME2014-17
Crystalline Evaluation of ZnO Thin Film Fabricated by Low-temperature Process for Flexible Transparent TFT
Hiraku Watanabe, Mohd Khafe Adie Bin, Hiroshi Yamauchi, Shigekazu Kuniyoshi, Masaaki Iizuka, Masatoshi Sakai, Kazuhiro Kudo (Chiba Univ.)
pp. 5 - 9

OME2014-18
Evaluation of thermal stability of organic electric optical device by thermally stimulated depolarization current measurement II
Ryoma Ikemoto, Kazuhiko Kinemura (Tokyo Inst. of Tech), Toshiki Yamada, Akira Otomo (NICT), Dai Taguchi, Takaaki Manaka, Mitsumasa Iwamoto (Tokyo Inst. of Tech)
pp. 11 - 16

OME2014-19
In-situ Evaluation of Layer-by-layer Deposited Films Using a Quartz-Crystal-Microbalance and Surface-Plasmon-Resonance Hybrid Sensor
Kazunari Shinbo, Keisuke Kawachi, Masahiro Hirokami, Yasuo Ohdaira, Akira Baba, Keizo Kato, Futao Kaneko (Niigata Univ.)
pp. 17 - 20

OME2014-20
Control of electrode/polymer interface by reactive SAM and deposition polymerization
Yuya Hagihara, Seong-Ho Kim, Kuniaki Tanaka (Tokyo Univ. Agricul. & Technol.), Rigoberto C. Advincula (Case Western Univ.), Hiroaki Usui (Tokyo Univ. Agricul. & Technol.)
pp. 21 - 26

OME2014-21
Study on Pruned Crossbar Switches, Part I -- Basics of crossbar switches and our reserch framework for developing new types of pruned crossbar switches --
Hitoshi Obara (Akita Univ.)
pp. 27 - 32

OME2014-22
An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (5) -- Natural Frequency and Damping Ratio(2) --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.)
pp. 33 - 38

OME2014-23
A consideration of a detuned sample length dependency in PIM measurement using Standing Wave Coaxial Tube Method
Kumiko Morita, Nobuhiro Kuga (Yokohama Nat'l Univ.)
pp. 39 - 42

OME2014-24
Crystalline structure and dislocation distribution of a ZnO thin films grown on a-plane sapphire substrates using high-energy H2O produced by a Pt-catalyzed H2 and O2 reaction
Tomoki Nakamura, Yuki Ishiduka, Naoya Yamaguchi, Yasuhiro Tamayama, Kanji Yasui (Nagaoka Univ. Technol.)
pp. 43 - 48

OME2014-25
Epitaxial growth of nitrogen-doped ZnO thin films on a-plane sapphire substrates using high-energy H2O generated by a catalytic reaction
Yuki Ohashi, Shingo Kanouchi, Naoya Yamaguchi, Yasuhiro Tamayama, Takahiro Kato, Kanji Yasui (Nagaoka Univ. Technol.)
pp. 49 - 53

OME2014-26
Electric/Magnetic Properties of Oxide Superlattices composed of Bi-related Perovskite
Yuta Watabe, Takahiro Oikawa, Takaaki Inaba, Keisuke Oshima, Kouichi Takase, Takuya Hashimoto, Hiroshi Yamamoto, Nobuyuki Iwata (Nihon Univ.)
pp. 55 - 60

OME2014-27
Improvement of Electrical Properties of n-ZnO/p-CuO Heterojunctions Prepared by Chemical Bath Deposition -- Insertion of Intermediate Layer and Thermal Annealing --
Tomoaki Terasako, Toshihiro Murakami, Atsushi Hyouodou, Sho Shirakata (Ehime Univ.)
pp. 61 - 66

OME2014-28
Crystal growth and Structure Analysis of the Cr2O3 thin films on LiNbO3 Substrates
Takumi Nakamura, Yutaro Hayashi, Takashi Sumida, Kosuke Hashimoto, Nobuyuki Iwata, Hiroshi Yamamoto (Nihon Univ.)
pp. 67 - 72

OME2014-29
Search og the surface treatment conditions of a YAlO3 single-crystal substance, and crystal growth of Cr2O3 thin films
Yutaro Hayashi, Takumi Nakamura, Takashi Sumida, Kosuke Hashimoto, Hiroshi Yamamoto, Nobuyuki Iwata (Nihon Univ.)
pp. 73 - 77

OME2014-30
Growth time dependence of mobility and carrier density of PbS thin films prepared by chemical bath deposition
Daiki Masu, Yasushi Takano, Akihiro Ishida (Shizuoka Univ.)
pp. 79 - 82

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan