IEICE Technical Report

Online edition: ISSN 2432-6380

Integrated Circuits and Devices

Workshop Date : 2023-10-31 / Issue Date : 2023-10-24

ICD2023-33
(See Japanese page.)
pp. 1 - 4

ICD2023-34
Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop
Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST)
pp. 5 - 9

ICD2023-35
Evaluation of Time-to-Digital Converter in Laser Fault Injection Detection on FPGA
Shungo Hayashi, Junichi Sakamoto (YNU/AIST), Masaki Chikano, Tsutomu Matsumoto (YNU)
pp. 10 - 15

ICD2023-36
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking
Kazuki Monta, Rikuu Hasegawa, Takuji Miki, Makoto Nagata (Kobe Univ.)
pp. 16 - 19

ICD2023-37
CPA ToggleToggle-based Simulation against Multiplier for Pairingairing-based Cryptography
Saito Kikuoka, Ikeda Makoto (Tokyo Univ.)
pp. 20 - 25

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan