|
Chair |
|
Shigeru Yanagi (National Defense Academy) |
Vice Chair |
|
Kazuaki Wakai (NHK) |
Secretary |
|
Tetsushi Yuge (National Defense Academy), Mitsuhiro Kimura (Hosei Univ.) |
Assistant |
|
Naoto Kaio (Hiroshima Shudo Univ.), Hisoyasu Mawatari (NTT) |
|
|
Chair |
|
Masaaki Kuzuhara (Univ. of Fukui) |
Vice Chair |
|
Tamotsu Hashidume (Hokkaido Univ.) |
Secretary |
|
Shin-ichiro Takatani (Hitachi), Manabu Arai (New JRC) |
Assistant |
|
Naoki Hara (Fujitsu Labs.), Koichi Murata (NTT) |
|
|
Chair |
|
Tanemasa Asano (Kyushu Univ.) |
Vice Chair |
|
Toshihiro Sugii (Fujitsu) |
Secretary |
|
Shigeru Kawanaka (Toshiba), Hisahiro Anzai (Sony) |
Assistant |
|
Syunichiro Ohmi (Tokyo Inst. of Tech.) |
|
Conference Date |
Fri, Nov 16, 2007 13:00 - 16:35 |
Topics |
|
Conference Place |
Chuo-Denki-Kurabu |
Address |
2-1-25, Doujimahama, Kita-ku, Osaka-shi, Japan |
Transportation Guide |
12 minutes walk from JR Osaka station, or 6 minutes walk from JR Kita-sinti station http://www.chuodenki-club.or.jp/map/annai.html |
Contact Person |
06-6345-6351 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Nov 16 PM 13:00 - 16:35 |
(1) |
13:00-13:25 |
Electrical Characterization of Yttriumaluminate(YAlO)Film R2007-46 ED2007-179 SDM2007-214 |
Keiko Matsunouchi, Naoyoshi Komatsu, Chiharu Kimura, Hidemitsu Aoki, Takashi Sugino (Osaka Univ.) |
(2) |
13:25-13:50 |
Galvanic Corrosion Suppression of High-k/Metal Gates R2007-47 ED2007-180 SDM2007-215 |
Daisuke Watanabe, Hidemitsu Aoki, Saori Hotta, Chiharu Kimura, Takashi Sugino (Osaka Univ) |
(3) |
13:50-14:15 |
Oxidation of SiC and GaN Surface in High Pressure and High Temperature Water R2007-48 ED2007-181 SDM2007-216 |
Takashi Futatsuki, Taro Oe (Organo Corp.), Hidemitsu Aoki, Naoyoshi Komatsu, Chiharu Kimura, Takashi Sugino (Osaka Univ.) |
(4) |
14:15-14:40 |
High Stability of Drain Current at High Temperatures in Multi-Mesa-Channel AlGaN/GaN HEMT R2007-49 ED2007-182 SDM2007-217 |
Takahiro Tamura, Junji Kotani, Kota Ohi, Tamotsu Hashizume (Hokkaido Univ.) |
|
14:40-14:55 |
Break ( 15 min. ) |
(5) |
14:55-15:20 |
Reliability Study of AlGaN/GaN HEMTs Device R2007-50 ED2007-183 SDM2007-218 |
Keiichi Matsushita, Shinichiro Teramoto, Hiroyuki Sakurai, Jeoungchill Shim, Hisao Kawasaki, Kazutaka Takagi, Yoshiharu Takada, Kunio Tsuda (Toshiba) |
(6) |
15:20-15:45 |
Degradation-Mode Analysis for Highly Reliable GaN-HEMT R2007-51 ED2007-184 SDM2007-219 |
Yusuke Inoue, Satoshi Masuda, Masahito Kanamura, Toshihiro Ohki, Kozo Makiyama, Naoya Okamoto, Kenji Imanishi, Toshihide Kikkawa, Naoki Hara, Hisao Shigematsu, Kazukiyo Joshin (Fujitsu Labs. Ltd.) |
(7) |
15:45-16:10 |
Leakage Current Screening for AlGaN/GaN HEMT Mass-Production R2007-52 ED2007-185 SDM2007-220 |
Fumikazu Yamaki, Kazuaki Ishii, Masahiro Nishi, Hitoshi Haematsu, Yasunori Tateno, Haruo Kawata (EUD) |
(8) |
16:10-16:35 |
A New TDDB Degradation Model Based on Cu Ion Drift in Cu Interconnect Dielectrics R2007-53 ED2007-186 SDM2007-221 |
Naohito Suzumura, Shigehisa Yamamoto, , , Junko Komori, (Renesas Technology Corp.) |
Announcement for Speakers |
General Talk (25) | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
R |
Technical Committee on Reliability (R) [Latest Schedule]
|
Contact Address |
Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E-: gen |
ED |
Technical Committee on Electron Device (ED) [Latest Schedule]
|
Contact Address |
Manabu Arai(New JRC)
TEL: 049-278-1477、FAX: 049-278-1419
E-: injr
Shinichiro Takatani(Hitachi)
TEL: 049-278-1477、FAX: 049-278-1419
E-: er
Koichi Murata(NTT)
TEL:046-240-2871、FAX:046-270-2872
E-: aecl
Hara Naoki (Fujitsu Lab.)
TEL : 046-250-8242、FAX : 046-250-4337
E- : nf |
SDM |
Technical Committee on Silicon Device and Materials (SDM) [Latest Schedule]
|
Contact Address |
Yasushiro Nishioka (Nihon University, College of Science and Technology)
TEL047-469-6482,FAX047-467-9504
E-:etn-u,acmsk |
Last modified: 2007-09-25 11:35:28
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