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| Chair |
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Nobuyasu Kanekawa (Hitachi) |
| Vice Chair |
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Michiko Inoue (NAIST) |
| Secretary |
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Koji Iwata (RTRI), Tatsuhiro Tsuthiya (Osaka Univ.) |
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| Conference Date |
Fri, Jun 20, 2014 13:15 - 16:50 |
| Topics |
Design/Test/Verification |
| Conference Place |
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Jun 20 PM
13:15 - 14:55 |
| (1) |
13:15-13:40 |
Development of a delay time measurement circuit by inserting buffers  DC2014-10 |
Takuya Yamamoto, Yukiya Miura (Tokyo Metropolitan Univ.) |
| (2) |
13:40-14:05 |
A method of LSI degradation estimation using ring oscillators DC2014-11 |
Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) |
| (3) |
14:05-14:30 |
A X-Filling Method for Low-Capture-Power Scan Test Generation DC2014-12 |
Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara (Kyushu Inst. of Tech.) |
| (4) |
14:30-14:55 |
Capture Power Evaluation for A Low Power BIST Method Using A TEG Chip DC2014-13 |
Toshiya Nishida (Kyushu Inst. of Tech.), Senling Wang (Ehime Univ.), Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.) |
| |
14:55-15:10 |
Break ( 15 min. ) |
Fri, Jun 20 PM
15:10 - 16:50 |
| (5) |
15:10-15:35 |
A Fault Tolerant Response Analyzer for Built-in Self-test DC2014-14 |
Yuki Fukazawa (Mie Univ.), Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) |
| (6) |
15:35-16:00 |
Floating-point Multiplier with Reduced Precision Error Checking by Partial Duplication DC2014-15 |
Nobutaka Kito (Chukyo Univ.), Kazushi Akimoto, Naofumi Takagi (Kyoto Univ.) |
| (7) |
16:00-16:25 |
A Binding Method for Hierarchical Testability Using Results of Test Environment Generation DC2014-16 |
Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) |
| (8) |
16:25-16:50 |
An evaluation for Testability of Functional k-Time Expansion Models DC2014-17 |
Tetsuya Masuda, Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
| Contact Address |
|
Last modified: 2014-04-18 13:54:15
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