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Committee Date Time Place Paper Title / Authors Abstract Paper #
OME, SDM 2011-04-15
11:30		 Saga AIST Kyushu Center Degradation analysis of organic photovoltaic cells for high durability
Toshihiro Yamanari, Yuji Yoshida (AIST) SDM2011-5 OME2011-5		 For the practical use of organic photovoltaic cells (OPV), the high durability is much important feature. We focused on ... [more] SDM2011-5 OME2011-5
pp.17-20
EMD, R 2011-02-18
15:00		 Shizuoka Shizuoka Univ. (Hamamatsu) Detection of degradation sign of LSI operation using IDDQ
Shunsuke Sakamoto, Masaru Sanada (KUT) R2010-46 EMD2010-147		 VDD supply current (IDDQ) information has been applied to detect LSI evaluation technology, IDDQ which has high fault de... [more] R2010-46 EMD2010-147
pp.25-30
EMD 2010-11-12
13:15		 Overseas Xi'an Jiaotong University A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Modeling (10) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111		 A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the ver... [more] EMD2010-111
pp.185-188
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