Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] |
2020-01-23 15:15 |
Tottori |
Tottori Univ. |
[Invited Lecture]
Surface Treatment using Atomic Hydrogen for Semiconductor Process Akira Heya (Univ. of Hyogo) |
To realize flexible displays and sheet computers, we have tried to develop the novel surface treatment, named Atomic Hyd... [more] |
|
RECONF, CPSY, DC, IPSJ-ARC (Joint) [detail] |
2017-05-23 15:10 |
Hokkaido |
Noboribetsu-Onsen Dai-ichi-Takimoto-Kan |
CPSY2017-4 DC2017-4 RECONF2017-21 |
A CMOS Ising Computing based on Ising model, which effectively solves combinational optimization problems necessary for ... [more] |
CPSY2017-4 DC2017-4 RECONF2017-21 pp.15-20(CPSY), pp.15-20(DC), pp.111-116(RECONF) |
ED, SDM |
2017-02-24 17:10 |
Hokkaido |
Centennial Hall, Hokkaido Univ. |
Analysis for Efficiency Potential of Next Generation Solar Cells Masafumi Yamaguchi, Kan-Hua Lee, Kenji Araki, Nobuaki Kojima (Toyota Tech. Inst.) ED2016-142 SDM2016-159 |
Efficiency potential for various types of solar cells such as crystalline Si, III-V and multi-junction, CIGS and CdTe so... [more] |
ED2016-142 SDM2016-159 pp.67-72 |
VLD, CAS, MSS, SIP |
2016-06-16 10:10 |
Aomori |
Hirosaki Shiritsu Kanko-kan |
Automatic Test Pattern Generation for Multiple Stuck-At Faults: When Testing for Single Faults is Insufficient Conrad JinYong Moore, Amir Masoud Gharehbaghi, Masahiro Fujita (Univ. of Tokyo) CAS2016-3 VLD2016-9 SIP2016-37 MSS2016-3 |
As fabricated circuitry gets larger and denser, modern industrial ATPG techniques which focus on the detection of single... [more] |
CAS2016-3 VLD2016-9 SIP2016-37 MSS2016-3 pp.13-18 |
SDM |
2012-12-07 15:30 |
Kyoto |
Kyoto Univ. (Katsura) |
Improvement of conversion efficiency for solar cell with MOS structure. Takahiro Kobayashi, Naoto Matsuo, Akira Heya (Univ. of Hyogo) SDM2012-132 |
The energy loss of solar cell due to the recombination of holes and electrons which are excited by the incident solar be... [more] |
SDM2012-132 pp.101-105 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-27 09:00 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
A Method to Parallelize Simulated Annealing Algorithm by Generating Look-ahead Neighbor Solutions Yusuke Ota, Kazuhito Ito (Saitama Univ.) VLD2012-73 DC2012-39 |
Simulated annealing (SA) is a general method to solve combinational optimization problems. SA generates a neigh¬bor solu... [more] |
VLD2012-73 DC2012-39 pp.81-86 |
SDM |
2010-11-12 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Modeling of Single-Event-Transient Pulse Generation in Inverter Cells Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180 |
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic ... [more] |
SDM2010-180 pp.47-52 |
DC |
2010-06-25 14:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Class of Partial Thru Testable Sequential Circuits with Multiplexers Nobuya Oka, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2010-9 |
Partially thru testable sequential circuits are known to be practically testable, and a condition for the testable seque... [more] |
DC2010-9 pp.7-11 |
RECONF |
2009-05-14 15:10 |
Fukui |
|
Proposal and Implementation of High Throughput Algorithm for Combination Generation Akira Tsuji, Norio Yamagaki, Satoshi Kamiya (NEC) RECONF2009-5 |
Combinatorial optimization problems are widely exist.
Generally they are solved by approximate means like greedy method... [more] |
RECONF2009-5 pp.25-30 |
MSS |
2007-06-29 10:15 |
Okinawa |
|
An algorithm to enumerate all the elementary T-invariants of auto-generated Petri nets Ryo Yamaguchi, Ryosuke Murakami, Mitsuru Nakata, Qi-Wei Ge (Yamaguchi Univ.) CST2007-9 |
In this paper, we propose an algorithm to enumerate all the elementary
T-invariants of auto-generated Petri nets that ... [more] |
CST2007-9 pp.15-20 |