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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 11 of 11  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC, SS 2015-10-13
15:00
Nara Todaiji Culture Center (Nara) The Dual System Consisting of Two Modules Which Depend on Each Other in State Recovery Phase
Aromhack Saysanasongkham, Satoshi Fukumoto (Tokyo Metropolitan Univ.) SS2015-38 DC2015-28
This paper discusses the reliability evaluation for 1-out-of-2 system with two-stage repair modes, i.e., hardware restor... [more] SS2015-38 DC2015-28
pp.17-21
CPSY, DC, IPSJ-ARC
(Joint) [detail]
2015-08-05
10:45
Oita B-Con Plaza (Beppu) Testbeds of a Highly Reliable Method for CANs in High Electromagnetic Environments
Muneyuki Nakamura, Mamoru Ohara (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Aromhack Saysanasongkham, Kazuya Sakai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) CPSY2015-26 DC2015-22
In controller area networks (CANs) on the modern electronic vehicles (EVs) and hybrid vehicles (HVs), the noise level ca... [more] CPSY2015-26 DC2015-22
pp.129-136(CPSY), pp.1-8(DC)
DC, CPSY 2015-04-17
09:00
Tokyo   Redundant Configuration on FPGA with Rejuvenation for Real Time Applications
Aromhack Saysanasongkham, Satoshi Fukumoto (Tokyo Metropolitan Univ.) CPSY2015-1 DC2015-1
SRAM-based FPGAs are susceptible to SEU which is induced by high energy particles or radiation. An SEU can corrupt the s... [more] CPSY2015-1 DC2015-1
pp.1-6
DC 2015-02-13
10:00
Tokyo Kikai-Shinko-Kaikan Bldg Studies on FPGA Rejuvenation
Aromhack Saysanasongkham, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2014-78
In this paper, feasibility studies on implementing rejuvenation techniques on SRAM-based FPGAs are conducted. As a preli... [more] DC2014-78
pp.1-6
DC 2014-12-19
15:10
Toyama   Studies on Reliability Evaluation Techniques for Triple Register Circuits
Naoki Midorikawa, Muneyuki Nakamura, Aromhack Saysanasongkham, Kazuya Sakai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2014-72
This paper discusses the reliability evaluation technique for the triple register circuit which our research group had p... [more] DC2014-72
pp.29-32
DC 2014-10-27
16:25
Tokyo Kikai-Shinko-Kaikan Bldg. A Note on Hybrid ARQ for DC-DC Converter Noise in Controller Area Networks
Muneyuki Nakamura (Tokyo Metropolitan Univ.), Mamoru Ohara (TMITRI), Aromhack Saysanasongkham (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Kazuya Sakai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2014-25
In controller area networks (CANs) on the modern electronic vehicles (EVs) and hybrid vehicles (HVs), the noise level ca... [more] DC2014-25
pp.23-28
DC, CPSY 2013-04-26
13:00
Tokyo   An Approach to Highly Reliable Scheme for a Digital Power Control
Kenta Imai, Aromhack Saysanasongkham, Masayuki Arai, Satoshi Fukumoto, Keiji Wada (Tokyo Metropolitan Univ.) CPSY2013-1 DC2013-1
Recently, a microcomputer and a FPGA are apt to be used for control of the power conversion circuits because of easily c... [more] CPSY2013-1 DC2013-1
pp.1-6
DC 2012-12-14
14:45
Fukui Aossa (Fukui) Fault Tolerance of an In-vehicle LAN by CAN Protocol under Severe Electro-magnetic Noise
Masahiko Negishi, Aromhack Saysanasongkham, Masayuki Arai, Mamoru Ohara, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2012-75
This paper examines the fault tolerance of an in-vehicle LAN under high electromagnetic environment.
First, we present ... [more]
DC2012-75
pp.11-15
CPSY, DC 2012-04-10
13:00
Tokyo   A Processor to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment by Using Built in Self Test
Masahiko Negishi, Aromhack Saysanasongkham, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) CPSY2012-1 DC2012-1
This paper releases a report of the application for the fault tolerant sequential circuit technique against the periodic... [more] CPSY2012-1 DC2012-1
pp.1-6
DC 2011-10-20
11:30
Tokyo   A Study on Sequential Circuits Tolerating for Transient Faults in a Highly Electromagnetic Environment
Aromhack Saysanasongkham, Kenta Imai, Yoshifumi Koyama, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2011-21
Recently, research on miniaturizing and densifying the power converter circuit are showing significant progressions. Con... [more] DC2011-21
pp.7-11
DC, CPSY
(Joint)
2011-07-28
15:45
Kagoshima   Recent Research Trends on Transient-Fault-Tolerant Dependable Processors
Yoshifumi Koyama, Kenta Imai, Aromhack Saysanasongkham, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2011-16
 [more] DC2011-16
pp.7-12
 Results 1 - 11 of 11  /   
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