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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS 2024-04-19
15:00		 Tokyo
(Primary: On-site, Secondary: Online)		 HWS2024-2 (To be available after the conference date) [more] HWS2024-2
pp.3-7
EMCJ 2023-11-24
16:15		 Tokyo Kikai-Shinko-Kaikan
(Primary: On-site, Secondary: Online)		 Fundamental Study on the Influence of Frequency Multiplication Ratio of Phase-Locked loop on Fault Injection into Cryptographic Modules
Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-80		 (To be available after the conference date) [more] EMCJ2023-80
pp.46-50
ICD, HWS 2023-10-31
13:55		 Mie  
(Primary: On-site, Secondary: Online)		 Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop
Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2023-55 ICD2023-34		 (To be available after the conference date) [more] HWS2023-55 ICD2023-34
pp.5-9
EMCJ 2023-06-09
16:20		 Hokkaido Otaru Chamber of Commerce & Industry
(Primary: On-site, Secondary: Online)		 Estimating Transmission Efficiency of Intentional Electromagnetic Interference Using Fault Occurrence Rate from Cryptographic Devices
Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-28		 Fault injection attacks using intentional electromagnetic interference (IEMI) against cryptographic devices have become ... [more] EMCJ2023-28
pp.82-86
HWS, ICD [detail] 2021-10-19
10:50		 Online Online Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase
Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17		 A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] HWS2021-43 ICD2021-17
pp.13-18
EMCJ 2019-07-18
13:35		 Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental study on influence of intentional electromagnetic interference on IC communication
Hikaru Nishiyama, Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2019-23		 Low-Power Intentional Electromagnetic Interference (IEMI) has been reported, which causes malfunction without damaging t... [more] EMCJ2019-23
pp.29-33
 Results 1 - 6 of 6  /   
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