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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2018-04-19 10:10 |
Tokyo |
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Reliability Enhancement Technique with Horizontal Error Detection and Vertical-LDPC in 3D-TLC NAND Flash Memories Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Kyoji Mizoguchi, Ken Takeuchi (Chuo Univ.) ICD2018-1 |
Conventional Asymmetric Coding (AC) has been proposed for improving NAND flash memories. In this work, Horizontal Error ... [more] |
ICD2018-1 pp.1-6 |
SDM |
2018-01-30 13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Lateral Charge Migration Suppression Technique of 3D-NAND Flash by Vth Nearing Kyoji Mizoguchi, Shohei Kotaki, Yoshiaki Deguchi, Ken Takeuchi (Chuo Univ.) SDM2017-93 |
In the near data computing, a SSD controller embeds more processing units and RAMs to execute a part of application whic... [more] |
SDM2017-93 pp.9-12 |
ICD, CPSY |
2016-12-15 15:30 |
Tokyo |
Tokyo Institute of Technology |
[Poster Presentation]
A Highly Reliable Method with Data-Retenrion Characteristics in TLC NAND Flash Memories Toshiki Nakamura, Yoshiaki Deguchi, Ken Takeuchi (Chuo Univ.) ICD2016-73 CPSY2016-79 |
The capacity of NAND flash memory can be expanded by multi-level cell technology. In particular, 3-bit/cell triple-level... [more] |
ICD2016-73 CPSY2016-79 p.65 |
ICD, CPSY |
2016-12-15 15:30 |
Tokyo |
Tokyo Institute of Technology |
[Poster Presentation]
Reduction of Data-Retention Error in TLC NAND Flash Memories Yuichi Sato, Yoshiaki Deguchi, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2016-76 CPSY2016-82 |
The cost of NAND flash memory is reduced by scaling and multi-level cell technologies. However, the reliability of tripl... [more] |
ICD2016-76 CPSY2016-82 p.75 |
ICD, CPSY |
2015-12-17 16:00 |
Kyoto |
Kyoto Institute of Technology |
[Poster Presentation]
Bit-Error Analysis in TLC NAND flash memories. Yoshiaki Deguchi, Tsukasa Tokutomi, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2015-75 CPSY2015-88 |
The capacity of NAND flash memory can be expanded by increasing the bit density. In particular, 3-bit/cell triple-level ... [more] |
ICD2015-75 CPSY2015-88 p.49 |
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