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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 78  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS, ICD [detail] 2021-10-19
15:25
Online Online Fundamental Study on Individual Identification of Printed Circuit Boards Using Capacitance Sensors
Ayaki Tachikake, Shugo Kaji, Daisuke Fujitomo, Yu-ichi Hayashi (NAIST) HWS2021-50 ICD2021-24
Individual identification technology using Physical Unclonable Functions (PUFs) guarantees the authenticity of semicondu... [more] HWS2021-50 ICD2021-24
pp.49-52
HWS, VLD [detail] 2020-03-06
13:00
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Fundamental Study on Fault Analysis with Non-Uniform Faulty Values Caused at Fault Injection into Sequential Circuit
Takumi Okamoto, Daisuke Fujimoto (NAIST), Kazuo Sakiyama, Li Yang (UEC), Yu-ichi Hayashi (NAIST) VLD2019-128 HWS2019-101
Fault analysis for the cryptographic module is roughly divided into two phases; those are injecting transient faults and... [more] VLD2019-128 HWS2019-101
pp.197-201
HWS
(2nd)
2019-12-06
16:00
Tokyo Asakusabashi Hulic Conference [Poster Presentation] Evaluation of Information Leakage Induced by IEMI from ICs with Multiple Data Communication Lines
Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST)
 [more]
EMCJ, IEE-SPC
(Joint)
2019-11-15
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. Measurement of an Effect of Resolution of Side Channel Waveform on Acquisition of Secret Key
Kohei Utsumi (Tohoku Univ), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ) EMCJ2019-73
A side-channel attack is known as a serious threat which can obtain a secret key by analyzing physical information leaka... [more] EMCJ2019-73
pp.13-16
ISEC, SITE, ICSS, EMM, HWS, BioX, IPSJ-CSEC, IPSJ-SPT [detail] 2019-07-24
09:55
Kochi Kochi University of Technology Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage
Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43
The threats of electromagnetic (EM) information leakage from the input/output (I/O) signal of an IC mounted on a de-vice... [more] ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43
pp.235-238
ISEC 2019-05-17
17:00
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Five-Card AND Protocol in Committed Format Using Only Practical Shuffles (from APKC 2018)
Yuta Abe (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2019-11
In this invited talk, we introduce the paper ``Five-Card AND Protocol in Committed Format Using Only Practical Shuffles'... [more] ISEC2019-11
p.49
HWS 2019-04-12
15:30
Miyagi Tohoku University Analysis of information leakage induced by radio module transmitting EM waves
Junichi Sakamoto (YNU), Masahiro Kinugawa (NIT, Sendai College), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST), Tsutomu Matsumoto (YNU) HWS2019-5
(To be available after the conference date) [more] HWS2019-5
pp.25-29
HWS 2019-04-12
15:55
Miyagi Tohoku University Fundamental Study on Suppression of Self-Interference Wave Caused by Intentional Information Leakage with IEMI
Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Diasuke Fujimoto, Yu-ichi Hayashi (NAIST) HWS2019-6
There is a threat of information leakage through unintentional electromagnetic (EM) emissions from equipment. The feasib... [more] HWS2019-6
pp.31-35
EMD 2019-03-01
11:15
Tokyo   Fundamental study of the effect of tightening torque reduction on high frequency circuit elements of contact boundaries
Takashi Narimatsu, Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMD2018-61
In case of contact failure in the connector at interconnected electronics devices, there is a possibility to descend the... [more] EMD2018-61
pp.13-16
HWS, VLD 2019-02-28
16:45
Okinawa Okinawa Ken Seinen Kaikan Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations
Shugo Kaji (NAIST), Masahiro kinugawa (NIT), Daisuke Fujimoto (NAIST), Laurent Sauvage, Jean-Luc Danger (Telecom ParisTech), Yu-ichi Hayashi (NAIST) VLD2018-120 HWS2018-83
There is a possibility that electronic devices which contain counterfeited/cloned ICs or electronic components cause ser... [more] VLD2018-120 HWS2018-83
pp.163-167
HWS
(2nd)
2018-12-13
16:10
Tokyo Tokyo Univ. Takeda Bldg. Takeda Hall [Poster Presentation] Fundamental Study on Randomness Evaluation Method of True Random Number Generator Using Amplitude Probability Distribution
Saki Osuka, Daisuke Fujimoto (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven), Yu-ichi Hayashi (NAIST)
(Advance abstract in Japanese is available) [more]
HWS
(2nd)
2018-12-13
16:10
Tokyo Tokyo Univ. Takeda Bldg. Takeda Hall [Poster Presentation] Fundamental Study on Estimation of Sensing Timing Based on Observation of EM Radiation from Ultrasonic Range Finder
Daisuke Fujimoto, Yu-ichi Hayashi (NAIST)
(Advance abstract in Japanese is available) [more]
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] Fundamental Study on Degradation of Randomness in TRNG Due to Intentional Electromagnetic Interference
Saki Osuka, Daisuke Fujimoto (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven), Yu-ichi Hayashi (NAIST) EMCJ2018-66
Attacks that degrade the randomness of a true random number generator (TRNG) by physical attacks on entropy sources, whi... [more] EMCJ2018-66
pp.35-36
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] A Specification Method of Faulty Bytes in Cryptographic Module Using EM Information Leakage
Naoto Saga (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-68
Fault analysis methods such as Differential Fault Analysis (DFA) need ciphertexts which have specific timing faults and ... [more] EMCJ2018-68
pp.39-40
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] Study on Estimation of Sensing Timing Based on Observation of EM Radiation from Ultrasonic Range Finder
Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-76
Recently, Various studies on instrumentation security which aims spoofing on sensor are reported. EM radiation from sens... [more] EMCJ2018-76
pp.55-56
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] Influence of IEMI considering injected signal phase on faulty outputs in a cryptographic module
Mitsuki Takenouchi (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-79
In a fault injection method based on Intentional Electromagnetic Interference (IEMI) from a power line, the phase of the... [more] EMCJ2018-79
pp.61-62
EMD 2018-11-09
15:55
Tokyo The University of Electro-Communications Study on the Effect of Surface Condition on High-Frequency Transmission Characteristics
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2018-46
When a connector connecting electric devices has loose contact or degradation over time, it causes contact failure. In p... [more] EMD2018-46
pp.33-36
EMD 2018-11-09
16:20
Tokyo The University of Electro-Communications Fundamental Study on the Effect of Torque Value at Connector on Equivalent Circuit of Contact Boundary
Daisuke Fujimoto, Takashi Narimatsu, Yu-ichi Hayashi (NAIST) EMD2018-47
In a situation where the torque management is insufficient, contact failure could occur in the connector as the intercon... [more] EMD2018-47
pp.37-41
EMCJ 2018-07-27
13:00
Tokyo Kikai-Shinko-Kaikan Bldg. Study on the effect of torque value at connector on equivalent circuit of contact boundary
Takashi Narimatsu, Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-26
In a situation where the torque management is insufficient, contact failure could occur in the connector as the intercon... [more] EMCJ2018-26
pp.25-29
EMCJ 2018-07-27
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices
Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-30
Intentional electromagnetic interference (IEMI) is a threat to destroy integrated circuits (ICs) or elements by using hi... [more] EMCJ2018-30
pp.49-54
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