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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
WIT, HI-SIGACI 2023-12-07
Tokyo AIST Tokyo Waterfront (TBD) Modeling and Measurement of Walking States for Walking Assistance Using a Forearm-Supported Robotic Walker
Yuto Mori, Soichiro Yokoyama, Tomohisa Yamashita, Hidenori Kawamura (Hokkaido Univ.), Masato Mori (SUNCREER) WIT2023-28
Various robotic walkers are being developed to alleviate the burden of ambulation for individuals who find it challengin... [more] WIT2023-28
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-16
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Calculation of Isomorphic/Similar Topology using Graph Theory
Yuto Moriguchi, Nobukazu Takai (KIT) VLD2023-55 ICD2023-63 DC2023-62 RECONF2023-58
In an automatic integrated circuit design, huge number of circuits are generated and simulated, so the efficiency of cir... [more] VLD2023-55 ICD2023-63 DC2023-62 RECONF2023-58
Hokkaido   Improvement of generalization performance in fish species discrimination and catch prediction using echo sounder images
Yuto Mori, Keiji Suzuki, Masaaki Wada (FUN) AI2019-63
A Set-Net fishery has various problems. One of the problems is that it is difficult to cope with fishing restrictions fo... [more] AI2019-63
HCS 2020-01-25
Oita Room407, J:COM HorutoHall OITA (Oita) Persistency of the reverse caricature effect with Japanese face models
Yuto Morioka, Koyo Nakamura, Maiko Kobayashi, Katsumi Watanabe (Waseda Univ.) HCS2019-63
When we recognize a familiar person, exaggerating distinctive features of the face makes it easier to identify the perso... [more] HCS2019-63
ED, CPM, SDM 2015-05-29
Aichi Venture Business Laboratory, Toyohashi University of Technology Quantitative evaluation of temperature dependence of surface recombination velocities for 4H-SiC
Kimihiro Kohama, Yuto Mori, Masashi Kato, Masaya Ichimura (NIT) ED2015-30 CPM2015-15 SDM2015-32
The surface recombination velocity is one of the limiting factors for the carrier lifetime, which is an important parame... [more] ED2015-30 CPM2015-15 SDM2015-32
CPM, ED, SDM 2014-05-29
Aichi   Microwave reflectance from SiC in the high injection condition -- Toward accurate evaluation of the carrier lifetime --
Masashi Kato, Yuto Mori, Masaya Ichimura (NITech) ED2014-39 CPM2014-22 SDM2014-37
 [more] ED2014-39 CPM2014-22 SDM2014-37
EMD 2013-10-18
Kanagawa NTT Atsugi Research and Development Center Electrical and Mechanical Characteristics of ECR-Sputtered Carbon Thin Films Deposited on Various Silicon Substrates
Hiromi Uchiyamada, Tatsuo Ooisi, Ryuto Mori, Daiki Takahasi, Kentaro Ooisi, Shigeru Umemura (Chiba Inst. of Tech.), Shigeru Hirono (MES AFTY), Tomoyuki Kamata, Osamu Niwa (AIST) EMD2013-70
 [more] EMD2013-70
SDM, ED, CPM 2013-05-16
Shizuoka Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. Evaluation of carrier lifetime for 4H-SiC surfaces treated by various processes
Yuto Mori, Masashi Kato, Masaya Ichimura (Nagoya Inst. of Tech.) ED2013-16 CPM2013-1 SDM2013-23
For very high voltage SiC bipolar devices, the carrier lifetime is an important parameter which influences the device pe... [more] ED2013-16 CPM2013-1 SDM2013-23
 Results 1 - 8 of 8  /   
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