IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 109, Number 2

Integrated Circuits and Devices

Workshop Date : 2009-04-13 - 2009-04-14 / Issue Date : 2009-04-06

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Table of contents

ICD2009-1
[Invited Talk] A 1.6GB/s DDR2 128Mb Chain FeRAM with Scalable Octal Bitline and Sensing Schemes
Hidehiro Shiga, Daisaburo Takashima, Shinichiro Shiratake, Katsuhiko Hoya, Tadashi Miyakawa, Ryu Ogiwara, Ryo Fukuda, Ryosuke Takizawa, Kosuke Hatsuda, Fumiyoshi Matsuoka, Yasushi Nagadomi, Daisuke Hashimoto, Hisaaki Nishimura, Takeshi Hioka, Sumiko Dohmae (Toshiba Corp.)
pp. 1 - 6

ICD2009-2
[Invited Talk] Trend in Multi-Gigabit DRAM Technology and Low-Vt Small-Offset Gated Preamplifier for Sub-1-V Arrays
Satoru Akiyama, Tomonori Sekiguchi, Riichiro Takemura, Akira Kotabe, Kiyoo Itoh (Hitachi, Ltd.,)
pp. 7 - 12

ICD2009-3
[Invited Talk] MRAM technology trend and evolution, 32Mb MRAM development
Tadahiko Sugibayashi, Ryusuke Nebashi, Noboru Sakimura, Hiroaki Honjo, Shinsaku Saito (NEC), Yuichi Ito (NECEL), Sadahiko Miura, Yuko Kato, Kaoru Mori (NEC), Yasuaki Ozaki, Yosuke Kobayashi (NECEL), Norikazu Ohshima, Keizo Kinoshita, Tetsuhiro Suzuki, Kiyokazu Nagahara (NEC)
pp. 13 - 17

ICD2009-4
[Panel Discussion] Which memory technology win win the low-VDD race in SoC?
Hideto Hidaka (Renesas Tech.), Masanao Yamaoka (Hitachi, Ltd.), Shinji Miyano (Toshiba Corp.), Satoru Akiyama (Hitachi, Ltd.), Tadahiko Sugibayashi (NEC), Syoichiro Kawashima (Fujitsu Limited), Masataka Osaka (Panasonic)
p. 19

ICD2009-5
A Process-Variation-Tolerant Dual-Power-Supply SRAM with 0.179μm2 Cell in 40nm CMOS Using Level-Programmable Wordline Driver
Yuki Fujimura, Osamu Hirabayashi, Atsushi Kawasumi, Azuma Suzuki, Yasuhisa Takeyama, Keiichi Kushida, Takahiko Sasaki, Akira Katayama, Gou Fukano, Takaaki Nakazato, Yasushi Shizuki, Natsuki Kushiyama, Tomoaki Yabe (Toshiba Co.)
pp. 21 - 26

ICD2009-6
A 0.56-V 128kb 10T SRAM Using Column Line Assist (CLA) Scheme
Shusuke Yoshimoto, Yusuke Iguchi, Shunsuke Okumura, Hidehiro Fujiwara, Hiroki Noguchi (Kobe Univ.), Koji Nii (Renesas Technology Corp.), Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.)
pp. 27 - 32

ICD2009-7
A 7T/14T Dependable SRAM and Its Array Structure to Avoid Half Selection
Shunsuke Okumura, Hidehiro Fujiwara, Yusuke Iguchi, Hiroki Noguchi, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST-CREST)
pp. 33 - 38

ICD2009-8
[Invited Talk] A 113mm2 32Gb 3bit/Cell NAND Flash Memory and Recent Technology Trend of NAND Flash Memory
Takuya Futatsuyama, Norihiro Fujita, Naoya Tokiwa, Yoshihiko Shindo, Toshiaki Edahiro (Toshiba Corp.), Teruhiko Kamei, Hiroaki Nasu (SanDisk), Makoto Iwai, Koji Kato, Yasuyuki Fukuda, Naoaki Kanagawa, Naofumi Abiko (Toshiba Corp.), Masahide Matsumoto (SanDisk), Toshihiko Himeno, Toshifumi Hashimoto (Toshiba Corp.)
pp. 39 - 42

ICD2009-9
A 7.8MB/s 64Gb 4bit/Cell NAND Flash Memory in 43nm CMOS
Mitsuaki Honma (Toshiba Corp.), Cuong Trinh (SanDisk Corp.), Noboru Shibata, Takeshi Nakai, Mikio Ogawa, Junpei Sato, Yoshikazu Takeyama, Katsuaki Isobe (Toshiba Corp.), Binh Le, Farookh Moogat, Nima Mokhlesi, Kenji Kozakai, Patrick Hong, Teruhiko Kamei (SanDisk Corp.), Kiyoaki Iwasa (Toshiba Corp.)
pp. 43 - 46

ICD2009-10
[Invited Talk] A 1.8V 30nJ Adaptive Program-Voltage (20V) Generator for 3D-Integrated NAND Flash SSD
Tadashi Yasufuku, Koichi Ishida (Tokyo Univ.), Shinji Miyamoto, Hiroto Nakai (Toshiba), Makoto Takamiya, Takayasu Sakurai, Ken Takeuchi (Tokyo Univ.)
pp. 47 - 52

ICD2009-11
Reading method of NAND type 1-transistor FeRAM with pulse input
Koichi Sugano, Shigeyoshi Watanabe (Shonan Inst. of Tech.)
pp. 53 - 57

ICD2009-12
Study for Design Technology of stacked NAND type MRAM using spin transistor
Shouto Tamai, Shigeyoshi Watanabe (Shonan Inst. of Tech.)
pp. 59 - 64

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan