IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2009-06-19 / Issue Date : 2009-06-12

R2009-17
Observations and analyses on device structures for reliability of IC/LSI
Tsuneo Ajioka, Sumihisa Ishikawa, Keiichi Yamada (Toray Reaserch Center)
pp. 1 - 6

R2009-18
Consideration of short-term test method for Aluminum Electrolytic Capacitor
Kazuya Murakami, Kenji Adachi (Toshiba Corp.)
pp. 7 - 11

R2009-19
Investigation of latest failure analysis using by X-ray analyzer
Yoshiyuki Ihara, Yoshikazu Kobayashi (Kusumoto)
pp. 13 - 18

R2009-20
Faulure Analysis of connector for Power Supply -- The example of Galvani corrosion due to deficiency of plating thickness --
Koji Hisanaga (NEC Infrontia Corp.)
pp. 19 - 22

R2009-21
A study on Non-parametric Estimation of Software Reliability
Shintaro Mizoguchi, Tadashi Dohi (Hiroshima Univ.)
pp. 23 - 28

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan