Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [2019] | [Japanese] / [English]
ICD2016-1
[Invited Lecture]
A Cost Effective Test Screening Method on 40-nm 4-Mb Embedded SRAM for Low-power MCU
Yuta Yoshida (RSD), Yoshisato Yokoyama, Yuichiro Ishii (Renesas Electronics), Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi (RSD), Koji Nii (Renesas Electronics)
pp. 1 - 6
ICD2016-2
[Invited Lecture]
A 7T-SRAM with Data-Write Technique by Capacitive Coupling
Daisaburo Takashima, Masato Endo (Toshiba), Kazuhiro Shimazaki, Manabu Sai (Toshiba Microelectronics), Masaaki Tanino (Toshia Information Systems)
pp. 7 - 12
ICD2016-3
[Invited Lecture]
A 298-fJ/writecycle 650-fJ/readcycle 8T Three-Port SRAM in 28-nm FD-SOI Process Technology for Image Processor
Haruki Mori, Tomoki Nakagawa, Yuki Kitahara, Yuta Kawamoto, Kenta Takagi, Shusuke Yoshimoto, Shintaro Izumi (Kobe Univ.), Koji Nii (Renesas Electronics), Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.)
pp. 13 - 16
ICD2016-4
A 64kb 16nm Asynchronous Disturb Current Free 2-Port SRAM with PMOS Pass-Gates for FinFET Technologies
Hidehiro Fujiwara, Li-Wen Wang, Yen-Huei Chen, Koo-Cheng Lin, Dar Sun, Shin-Rung Wu, Jhon-Jhy Liaw, Chin-Yung Lin, Mu-Chi Chiang, Hung-Jen Liao, Shien-Yang Wu, Jonathan Chang (TSMC)
pp. 17 - 20
ICD2016-5
[Invited Lecture]
Visualization of Filament of ReRAM during Resistive Switching by in-situ Transmission Electron Microscopy
Yasuo Takahashi (Hokkaido Univ.), Masaki Kudo (Kyusyu Univ.), Masashi Arita (Hokkaido Univ.)
pp. 21 - 26
ICD2016-6
[Invited Lecture]
A 0.6V Operation ReRAM Program Voltage Generator with Adaptively Optimized Comparator Bias-Current for Batteryless IoT Local Device
Masahiro Tanaka, Tomoya Ishii, Shogo Hachiya, Sheyang Ning, Ken Takeuchi (Chuo Univ.)
pp. 27 - 32
ICD2016-7
[Invited Lecture]
Reliability Projecting for ReRAM based on Stochastic Differential Equation
Zhiqiang Wei (PSCS), Koji Eriguchi (Kyoto Univ.), Shunsaku Muraoka, Koji Katayama, Ryotaro Yasuhara, Kawai Ken, Yukio Hayakawa, Kazuhiko Shimakawa, Takumi Mikawa, Yoneda Shinichi (PSCS)
pp. 33 - 37
ICD2016-8
[Invited Lecture]
ReRAM reliability characterization and improvement by machine learning
Tomoko Ogura Iwasaki, Sheyang Ning, Hiroki Yamazawa, Chao Sun, Shuhei Tanakamaru, Ken Takeuchi (Chuo Univ.)
pp. 39 - 44
ICD2016-9
[Invited Lecture]
A Triple-Protection Structured COB FRAM with 1.2-V Operation and 1E17-Cycle Endurance
Hitoshi Saito, Ko Nakamura, Soichiro Ozawa, Naoya Sashida, Satoru Mihara, Yukinobu Hikosaka, Wensheng Wang, Tomoyuki Hori, Kazuaki Takai, Mitsuharu Nakazawa, Noboru Kosugi, Makoto Hamada, Shoichiro Kawashima, Takashi Eshita, Masato Matsumiya (FSL)
pp. 45 - 49
ICD2016-10
[Invited Lecture]
1T1MTJ STT-MRAM Cell Array Design with an Adaptive Reference Voltage Generator
Hiroki Koike, Sadahiko Miura, Hiroaki Honjo, Tosinari Watanabe, Hideo Sato, Soshi Sato, Takashi Nasuno, Yasuo Noguchi, Mitsuo Yasuhira, Takaho Tanigawa, Masaaki Niwa, Kenchi Ito, Shoji Ikeda, Hideo Ohno, Tetsuo Endoh (Tohoku Univ.)
pp. 51 - 56
ICD2016-11
[Invited Lecture]
Power reduction based on MRAM
Hiroaki Yoda, Shinobu Fujita (toshiba)
pp. 57 - 59
ICD2016-12
[Invited Talk]
Technology trends and near-future applications of embedded STT-MRAM
Shinobu Fujita (Toshiba)
pp. 61 - 64
ICD2016-13
[Invited Lecture]
Faster LBA scrambler utilized SSD with Garbage Collection Optimization
Chihiro Matsui, Asuka Arakawa, Chao Sun, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.)
pp. 65 - 69
ICD2016-14
[Invited Lecture]
Design of SCM/NAND Flash Hybrid SSD System for Each Data Access Pattern
Tomoaki Yamada, Shun Okamoto, Chao Sun, Shogo Hachiya, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.)
pp. 71 - 76
ICD2016-15
[Invited Talk]
A 90nm Embedded 1T-MONOS Flash Macro for Automotive Applications with 0.07mJ/8kB Rewrite Energy and Endurance Over 100M Cycles Under Tj of 175°C
Satoru Nakanishi, Hidenori Mitani, Ken Matsubara, Hiroshi Yoshida, Takashi Kono, Yasuhiko Taito, Takashi Ito, Takashi Kurafuji, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi (Renesas)
pp. 77 - 81
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.