Online edition: ISSN 2432-6380
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DC2022-82
Takumi Sugioka, Yoshikazu Nagamura (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metropolitan Univ.)
pp. 1 - 5
DC2022-83
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution
Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.)
pp. 6 - 11
DC2022-84
Taito Asaji, Tatsuhiro Tsuchiya (Osaka Univ.)
pp. 12 - 15
DC2022-85
A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints
Lele Jiang, Tatsuhiro Tsuchiya (Osaka Univ.)
pp. 16 - 20
DC2022-86
Analysis of the Relationship between the Error Recovery and Reliability on Approximate Multipliers
Kozuma, Tamaki, Wang,Qilin, Ichihara, Hideyuki, Inoue, Tomoo (Hiroshima City Univ.)
pp. 21 - 26
DC2022-87
Test Point Selection Method Using Graph Neural Networks and Deep Reinforcement Learning
Shaoqi Wei, Kohei Shiotani, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.)
pp. 27 - 32
DC2022-88
A Don't-Care Filling Method of Control Signals on Controllers for Two-Pattern Concurrent Testing
Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.)
pp. 33 - 38
DC2022-89
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for BIST
Yangling Xu, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (KSU)
pp. 39 - 44
DC2022-90
Stochastic flash ADC with variable input voltage range
Taira Sakaguchi, Satoshi Komatsu (Tokyo Denki Univ.)
pp. 45 - 50
DC2022-91
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability
Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU)
pp. 51 - 55
DC2022-92
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuit
Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech)
pp. 56 - 61
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.