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| Chair |
|
Masahiko Yoshimoto (Kobe Univ.) |
| Vice Chair |
|
Takeshi Yamamura (Fujitsu Labs.) |
| Secretary |
|
Toshimasa Matsuoka (Osaka Univ.), Ken Takeuchi (Chuo Univ.) |
| Assistant |
|
Osamu Watanabe (Toshiba), Shinichi Ouchi (AIST), Akira Tsuchiya (Kyoto Univ.) |
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| Conference Date |
Mon, Dec 17, 2012 09:30 - 17:55
Tue, Dec 18, 2012 09:30 - 16:35 |
| Topics |
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| Conference Place |
Royal Blue Hall, Tokyo Tech Front, Ookayama Campus, Tokyo Institute of Technology |
| Address |
Tokyo Tech Front, 2-12-1 Ookayama, Meguro, Tokyo, Japan |
| Transportation Guide |
One-minit walk from Ookayama Station.
http://www.titech.ac.jp/english/about/campus/index.html |
| Sponsors |
This workshop is co-sponsored by IEEE SSCS Japan and Kansai Chapters.
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Mon, Dec 17 AM
09:30 - 10:45 |
| (1) |
09:30-10:20 |
[Invited Talk]
Future of Japanese LSI designers
-- A barren dessert or paradise --  ICD2012-86 |
Hideharu Amano (Keio Univ.) |
| (2) |
10:20-10:45 |
Verification of an Estimation Method of Minimum Operation Voltage by Measurement ICD2012-87 |
Junya Kawashima, Hiroyuki Ochi, Hiroshi Tsutsui, Takashi Sato (Kyoto Univ.) |
Mon, Dec 17 AM
11:00 - 12:15 |
| (3) |
11:00-11:50 |
[Invited Talk]
Ambient Electronics using Flexible and Printed Electronics
-- Next-generation ICT and Medical -- ICD2012-88 |
Tsuyoshi Sekitani, Takao Someya (Univ. Tokyo) |
| (4) |
11:50-12:15 |
An Analysis and Evaluation of MOSFET Strain Sensor Using Pseudo-Hall Effect ICD2012-89 |
Tetsuya Umetsu, Tomochika Harada, Sumio Okuyama, Koichi Matsushita (Yamagata Univ.) |
Mon, Dec 17 PM
13:30 - 14:45 |
| (5) |
13:30-14:20 |
[Invited Talk]
High-performance STT-MRAM and Its Integration for Embedded Application ICD2012-90 |
Toshihiro Sugii, Yoshihisa Iba, Masaki Aoki, Hideyuki Noshiro, Koji Tsunoda, Akiyoshi Hatada, Masaaki Nakabayashi, Yuuichi Yamazaki, Atsushi Takahashi, Chikako Yoshida (LESP) |
| (6) |
14:20-14:45 |
A 250Msps, 0.5W eDRAM-based Search Engine applying full-route capacity dedicated FIB application ICD2012-91 |
Yasuto Kuroda, Yuji Yano, Hisashi Iwamoto (Renesas), Koji Yamamoto (RDC), kazunari Inoue (Nara National College of Tech./Osaka Univ.) |
Mon, Dec 17 PM
14:55 - 15:40 |
| (7) |
14:55-15:40 |
|
Mon, Dec 17 PM
15:55 - 17:55 |
| (8) |
15:55-17:55 |
[Poster Presentation]
Instantaneous Heart Rate Detection Using Short-Time Autocorrelation for Wearable Healthcare Systems ICD2012-92 |
Ken Yamashita, Masanao Nakano, Toshihiro Konishi, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) |
| (9) |
15:55-17:55 |
[Poster Presentation]
Single-Inductor, Dual-Output, Parallel-Boosting Architecture to Generate ReRAM and NAND Flash Memory Programming Voltages for 3D-Integrated Hybrid Solid-State Drives ICD2012-93 |
Shoto Nakajima (Chuo Univ.), Teruyoshi Hatanaka (Chuo Univ./Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) |
| (10) |
15:55-17:55 |
[Poster Presentation]
Near Threshold Voltage Word-Line Voltage Injection Scheme for Self-Convergence of Threshold Voltage Variation in Local Electron Injected Asymmetric Pass Gate Transistor 6T-SRAM ICD2012-94 |
Daisuke Kobayashi, Kousuke Miyaji (Chuo Univ.), Shinji Miyano (STARC), Ken Takeuchi (Chuo Univ.) |
| (11) |
15:55-17:55 |
[Poster Presentation]
Analyses of Code Length Dependence of Asymmetric Code for Highly Reliable SSDs with 20-40nm NAND Flash Memories ICD2012-95 |
Masafumi Doi (Chuo Univ.), Shuhei Tanakamaru (Chuo Univ./Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) |
| (12) |
15:55-17:55 |
[Poster Presentation]
A Hardware-Friendly Object Recognition Algorithm Using Log Polar Coordinate Transformation ICD2012-96 |
Makoto Wada, Tadashi Shibata (UT) |
| (13) |
15:55-17:55 |
[Poster Presentation]
A New Approach of the Analysis of the ISF in Oscillators with a Closed-Loop Control ICD2012-97 |
Junki Mizuno, Tsutomu Yoshimura, Shuhei Iwade, Hiroshi Makino (OIT), Yoshio Matsuda (Kanazawa Univ.) |
| (14) |
15:55-17:55 |
[Poster Presentation]
Low-Power Ferroelectric 6T4C Shadow SRAM for Normally-Off Computing ICD2012-98 |
Tomoki Nakagawa, Shusuke Yoshimoto, Yuki Kitahara, Koji Yanagida, Yohei Umeki, Shunsuke Okumura, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) |
| (15) |
15:55-17:55 |
[Poster Presentation]
3x Write and 5x Read Speed Increase for RRAM with Disturb Free Bipolar Operation ICD2012-99 |
Sheyang Ning (Chuo Univ./Univ. of Tokyo), Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.) |
| (16) |
15:55-17:55 |
[Poster Presentation]
Analysis of the Pull-in Range in a CDR-PLL with the Nonlinearity of the Phase Detector ICD2012-100 |
Shinji Shimizu, Tsutomu Yoshimura, Shuhei Iwade, Hiroshi Makino (OIT), Yoshio Matsuda (Kanazawa Univ.) |
| (17) |
15:55-17:55 |
[Poster Presentation]
A 2.4x-Real-Time VLSI Processor for 60-kWord Continuous Speech Recognition ICD2012-101 |
Yuki Miyamoto, Guangji He, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ) |
| (18) |
15:55-17:55 |
[Poster Presentation]
Hybrid ReRAM/MLC NAND SSDs with Data Fragmentation Suppression and Evaluation Platform ICD2012-102 |
Shun Okamoto, Kousuke Miyaji, Koh Johguchi, Ken Takeuchi (Chuo Univ.) |
| (19) |
15:55-17:55 |
[Poster Presentation]
Control Gate Length, Spacing and Stacked Layer Number Design for BiCS NAND Flash Memory ICD2012-103 |
Reo Hirasawa, Kousuke Miyaji, Ken Takeuchi (Chuo Univ) |
| (20) |
15:55-17:55 |
[Poster Presentation]
Evaluation Platform based on Transaction Model Base for 3D Hybrid ReRAM/MLC NAND SSD and Real Data Pattern Analysis ICD2012-104 |
Wataru Toriumi, Kousuke Miyaji, Koh Johguchi, Shogo Hachiya, Ken Takeuchi (Chuo Univ.) |
| (21) |
15:55-17:55 |
[Poster Presentation]
FPGA Implementation of HOG-based Real-Time Object Detection Processor ICD2012-105 |
Kenta Takagi, Kosuke Mizuno, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) |
| (22) |
15:55-17:55 |
[Poster Presentation]
About the system simulation methodology for the switching power converters ICD2012-106 |
Kei Watanabe, Tatsuya Furukawa, Yasuhiro Sugimoto (Chuo Univ.) |
| (23) |
15:55-17:55 |
[Poster Presentation]
Temperature Dependence of Phase Change Random Access Memory (PRAM) ICD2012-107 |
Toru Egami, Koh Johguchi, Ken Takeuchi (Chuo Univ) |
| (24) |
15:55-17:55 |
[Poster Presentation]
Single Inductor Dual Output DC-DC Boost converter with Serial Control ICD2012-108 |
Shu Wu, Yasunori Kobori, Mu Rong Li, Zhao Feng, Qulin Zhu, Shaiful Nizam Mohyar (Gunma Univ), Takahiro Odaguchi, Tetsuji Yamaguchi, Isao Nakanishi, Kimio Ueda (AKM Tech.), Jun-ichi Matsuda (AKPD), Nobukazu Takai, Haruo Kobayashi (Gunma Univ) |
| (25) |
15:55-17:55 |
[Poster Presentation]
Ultra-Low-Voltage Dynamic Amplifier ICD2012-109 |
James Lin, Masaya Miyahara, Akira Matsuzawa (Tokyo Inst. of Tech.) |
| (26) |
15:55-17:55 |
[Poster Presentation]
A Design of Patch Clamp Measurement System using 0.18μm CMOS Technology ICD2012-110 |
Wataru Nakayama, Ryuich Ohno, Yohei Yasuda, Takuya Kawashima, Nobuhiko Nakano (Keio Univ.) |
| (27) |
15:55-17:55 |
[Poster Presentation]
A Design of On-Chip Solar Cell and Regulated DC-DC Converter for Microsystem using 0.18μm CMOS Process ICD2012-111 |
Haruki Ono, Daiju Kikuchi, Kazuki Nomura, Nobuhiko Nakano (Keio Univ.) |
| (28) |
15:55-17:55 |
[Poster Presentation]
A 60-GHz CMOS Direct-Conversion Transceiver ICD2012-112 |
Seitaro Kawai, Ryo Minami, Ahmed Musa, Yuki Tsukui, Yasuaki Takeuchi, Kenichi Okada, Akira Matsuzawa (Titech) |
Tue, Dec 18 AM
09:30 - 10:45 |
| (29) |
09:30-09:55 |
A Hardware-Implementation-Friendly Algorithm Based on Hierarchical Models for Real-Time Human Action Recognition ICD2012-113 |
Kazumi Fukuda, Tadashi Shibata (Univ. of Tokyo) |
| (30) |
09:55-10:20 |
A Stable Chip-ID Generating Physical Uncloneable Function Using Random Address Errors in SRAM ICD2012-114 |
Hidehiro Fujiwara, Makoto Yabuuchi, Yasumasa Tsukamoto, Hirofumi Nakano, Toru Owada, Hiroyuki Kawai, Koji Nii (Renesas) |
| (31) |
10:20-10:45 |
28-nm HKMG GHz Digital Sensor for Detecting Dynamic Voltage Drops in Testing for Peak Power Optimization ICD2012-115 |
Mitsuhiko Igarashi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita, Kan Takeuchi (Renesas Electronics) |
Tue, Dec 18 AM
10:55 - 12:10 |
| (32) |
10:55-11:45 |
[Invited Talk]
Soft-error evaluation and mitigation technologies ICD2012-116 |
Taiki Uemura (Fujitsu Semiconductor Ltd.) |
| (33) |
11:45-12:10 |
A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop ICD2012-117 |
Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) |
Tue, Dec 18 PM
13:30 - 15:35 |
| (34) |
13:30-14:20 |
[Invited Talk]
CMOS analog mixed circuit and its applications ICD2012-118 |
Shouhei Kousai (Toshiba) |
| (35) |
14:20-14:45 |
High Efficiency 315MHz Transmitter with Dual Supply Voltage Scheme ICD2012-119 |
Shunta Iguchi (Univ. of Tokyo), Akira Saito, Kazunori Watanabe (STARC), Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo) |
| (36) |
14:45-15:10 |
Single Inductor Multi Output DC-DC Converter Design with Hythterisis Control ICD2012-120 |
Tatsunori Nagasima, Yasunori Kobori, Takahiro Sakai, Syunsuke Tanaka (Gunma Univ.), Takahiro Odaguchi, Tetsuji Yamaguchi, Isao Nakanishi, Kimio Ueda (AKM Tech.), Jun-ichi Matsuda (AKPD), Nobukazu Takai, Haruo Kobayashi (Gunma Univ.) |
| (37) |
15:10-15:35 |
Development of optical response current model of lateral pin photodiode ICD2012-121 |
Yosuke Imura, Kiyoshi Ise (SNCT) |
Tue, Dec 18 PM
15:45 - 16:35 |
| (38) |
15:45-16:35 |
[Invited Talk]
Challenges to top-level circuit couference
-- Experiences of former device researcher -- ICD2012-122 |
Kousuke Miyaji (Chuo Univ.) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| ICD |
Technical Committee on Integrated Circuits and Devices (ICD) [Latest Schedule]
|
| Contact Address |
Shin-ichi O'uchi, National Institute of AIST
Tel. +81-29-861-5068, fax. +81-29-861-5170
E- :     ou aist |
Last modified: 2012-12-03 11:54:50
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