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Technical Group on Information Sensing Technologies (ITE-IST) (Searched in: 2016)
Search Results: Keywords 'from:2016-08-01 to:2016-08-01'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 09:15 |
Osaka | Central Electric Club | [Invited Talk]
Accelerating the Sensing World through Imaging Evolution Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions)  SDM2016-48 ICD2016-16 |
This presentation introduces the evolution of image sensors and the future prospect of sensing applications utilizing th... [more] | SDM2016-48 ICD2016-16 p.1 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 10:00 |
Osaka | Central Electric Club | A fast-start up and fully-integrated 32-MHz clock generator for intermittent VLSI systems Hiroki Asano, Tetsuya Hirose, Taro Miyoshi, Keishi Tsubaki, Toshihiro Ozaki, Nobutaka Kuroki, Masahiro Numa (Kobe Univ.) SDM2016-49 ICD2016-17 |
This paper proposes a fully integrated 32-MHz relaxation oscillator (ROSC) capable of fast start-up time operation f... [more] |
SDM2016-49 ICD2016-17 pp.3-8 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 10:25 |
Osaka | Central Electric Club | A Low-Power Mixed-Domain Delta-Sigma Time-to-Digital Converter Using Charge-Pump and SAR ADC Anugerah Firdauzi, Zule Xu, Masaya Miyahara, Akira Matsuzawa (Tokyo Tech.) SDM2016-50 ICD2016-18 |
This paper presents a time-to-digital converter (TDC) using delta-sigma architecture which utilizes a charge pump as the... [more] | SDM2016-50 ICD2016-18 pp.9-14 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 14:30 |
Osaka | Central Electric Club | [Invited Talk]
Novel Pixel Structure with Stacked Deep Photodiode to Achieve High NIR Sensitivity and High MTF Hiroki Takahashi, Hiroshi Tanaka, Masahiro Oda, Mitsuyoshi Ando, Naoto Niisoe (TPSCo), Shinichi Kawai, Takuya Asano, Mitsugu Yoshita, Tohru Yamada (PSCS) SDM2016-51 ICD2016-19 |
Novel pixel structure with Stacked Deep Photodiode (SDP) has been newly developed for both high Near Infra-Red (NIR) sen... [more] | SDM2016-51 ICD2016-19 pp.41-44 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 15:25 |
Osaka | Central Electric Club | [Invited Lecture]
A 0.7V 1.5-to-2.3mW GNSS Receiver with 2.5-to-3.8dB NF in 28nm FD-SOI Ken Yamamoto, Kenichi Nakano, Gaku Hidai, Yuya Kondo, Hitoshi Tomiyama, Hideyuki Takano, Fumitaka Kondo, Yusuke Shinohe, Hidenori Takeuchi, Nobuhisa Ozawa (SSS), Shingo Harada, Shinichiro Eto, Mari Kishikawa, Daisuke Ide, Hiroyasu Tagami (Sony LSI Design) SDM2016-52 ICD2016-20 |
[more] | SDM2016-52 ICD2016-20 pp.45-48 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 15:50 |
Osaka | Central Electric Club | [Invited Talk]
A Wireless Power Transfer System with Enhanced Efficiency and Response by Fully-Integrated Fast-Tracking Wireless Constant-Idle-Time Control for Implants Toru Kawajiri (Keio Univ.), Huang Cheng (Broadcom), Hiroki Ihikuro (Keio Univ.) SDM2016-53 ICD2016-21 |
This paper introduces a fully-integrated wireless power transfer (WPT) system using wireless constant-idle-time control.... [more] | SDM2016-53 ICD2016-21 pp.49-52 |
| ICD, SDM, ITE-IST [detail] | 2016-08-02 09:00 |
Osaka | Central Electric Club | [Invited Talk]
Soft Error Immunity of Ultra-Low Voltage SRAM Masanori Hashimoto (Osaka Univ.) SDM2016-54 ICD2016-22 |
This paper discusses soft error immunity of near-threshold/subthreshold SRAM. In terrestrial environment, high-energy ne... [more] | SDM2016-54 ICD2016-22 pp.53-58 |
| ICD, SDM, ITE-IST [detail] | 2016-08-02 09:45 |
Osaka | Central Electric Club | [Invited Talk]
CMOS Analog IC Technologies Toward AI Era Toshimasa Matsuoka (Osaka Univ.) SDM2016-55 ICD2016-23 |
Some techniques for improvement of a RF transmitter IC with genetic algorithm, error correction of an A/D converter wi... [more] |
SDM2016-55 ICD2016-23 pp.59-61 |
| ICD, SDM, ITE-IST [detail] | 2016-08-02 10:40 |
Osaka | Central Electric Club | [Invited Talk]
Patch-type EEG System with Stretchable Electrode Sheet for Medical Application Shusuke Yoshimoto, Teppei Araki, Takafumi Uemura, Toshikazu Nezu, Masaya Kondo (Osaka Univ.), Kenichi Sasai (Panasonic), Masayuki Iwase, Hideki Satake, Akio Yoshida (Mektron), Mitsuru Kikuchi (Kanazawa Univ.), Tsuyoshi Sekitani (Osaka Univ.) SDM2016-56 ICD2016-24 |
[more] | SDM2016-56 ICD2016-24 p.63 |
| ICD, SDM, ITE-IST [detail] | 2016-08-02 11:25 |
Osaka | Central Electric Club | [Invited Talk]
A Low-power Biopotential Sensor ASIC Chipset capable of EEG Acquisition using Dry Electrodes Akinori Matsumoto, Koji Morikawa (Panasonic) SDM2016-57 ICD2016-25 |
An ASIC chipset of low-power consumption to realize electroencephalogram (EEG) monitoring using dry electrodes has been ... [more] | SDM2016-57 ICD2016-25 pp.65-70 |
| ICD, SDM, ITE-IST [detail] | 2016-08-02 13:20 |
Osaka | Central Electric Club | [Invited Talk]
Development of an ECoG wireless BMI system toward clinical applications Hiroshi Ando, Kenichi Takizawa (NICT), Takeshi Yoshida (Hiroshima Univ.), Kojiro Matsushita (Gifu Univ.), Seiji Kameda, Masayuki Hirata, Toshiki Yoshimine (Osaka Univ.), Takafumi Suzuki (NICT) SDM2016-58 ICD2016-26 |
[more] | SDM2016-58 ICD2016-26 pp.71-76 |
| ICD, SDM, ITE-IST [detail] | 2016-08-02 14:05 |
Osaka | Central Electric Club | [Invited Talk]
Features of retinal prosthesis using suprachoroidal transretinal stimulation
-- from an electrical circuit perspective -- Yasuo Terasawa, Kenzo Shodo, Koji Osawa (Nidek), Jun Ohta (NAIST) SDM2016-59 ICD2016-27 |
Several research groups globally have been developing retinal prostheses since the 1990s. We have been developing a reti... [more] | SDM2016-59 ICD2016-27 pp.77-79 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 09:00 |
Osaka | Central Electric Club | [Invited Talk]
SRAM PUF using Polycrystalline Silicon Channel FinFET and Its Evaluation Shin-ichi O'uchi, Yungxun Liu, Yohei Hori, Toshifumi Irisawa, Hiroshi Fuketa, Yukinori Morita, Shinji Migita, Takahiro Mori, Tadashi Nakagawa, Junichi Tsukada, Hanpei Koike, Meishoku Masahara, Takashi Matsukawa (AIST) SDM2016-60 ICD2016-28 |
[more] | SDM2016-60 ICD2016-28 pp.83-87 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 09:45 |
Osaka | Central Electric Club | [Invited Talk]
A ReRAM-based Physically Unclonable Function with Bit Error Rate < 0.5% after 10 years at 125°C for 40nm embedded application Yuhei Yoshimoto, Yoshikazu Katoh, Satoru Ogasahara, Zhiqiang Wei, Kazuyuki Kouno (Panasonic Semiconductor Solutions Co., Ltd.) SDM2016-61 ICD2016-29 |
This paper presents a secure application—a physically unclonable function (PUF)—that uses the physical prope... [more] | SDM2016-61 ICD2016-29 pp.89-94 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 10:40 |
Osaka | Central Electric Club | [Invited Talk]
Demonstration and performance improvement of ferroelectric HfO2-based tunnel junction Kamimuta Yuuichi, Shosuke Fujii, Tsunehiro Ino, Riichiro Takaishi, Yasushi Nakasaki, Masumi Saitoh (Toshiba) SDM2016-62 ICD2016-30 |
[more] | SDM2016-62 ICD2016-30 pp.95-98 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 11:25 |
Osaka | Central Electric Club | [Invited Talk]
A Three-Terminal Spin-Orbit Torque Switching Magnetic Memory Device
-- Toward Realization of High-Speed and Low-Power Nonvolatile Integrated Circuits -- Shunsuke Fukami, Tetsuro Anekawa, Ayato Ohkawara, Chaoliang Zhang, Hideo Ohno (Tohoku Univ.) SDM2016-63 ICD2016-31 |
Integrated circuits with non-volatile spintronics memory devices open up new pathways toward ultralow-power and high-per... [more] | SDM2016-63 ICD2016-31 pp.99-103 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 13:20 |
Osaka | Central Electric Club | [Invited Talk]
A 16nm FinFET Heterogeneous Nona-Core SoC Supporting Functional Safety Standard ISO26262 ASIL B Chikafumi Takahashi, Shinichi Shibahara, Kazuki Fukuoka, Jun Matsushima, Yuko Kitaji (Renesas System Design), Yasuhisa Shimazaki, Hirotaka Hara, Takahiro Irita (Renesas Electronics) SDM2016-64 ICD2016-32 |
This paper presents an SoC for the next generation of car infotainment, achieving high performance powered by nine heter... [more] | SDM2016-64 ICD2016-32 pp.105-110 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 14:15 |
Osaka | Central Electric Club | Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs Yasuhiro Ogasahara (AIST) SDM2016-65 ICD2016-33 |
This paper discusses impacts of flexible Vth control, low process variability, and steep SS with small on-current of new... [more] | SDM2016-65 ICD2016-33 pp.111-116 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 14:40 |
Osaka | Central Electric Club | PN-Body Tied Super Steep SS FET with Body Bias below 1V and Drain Bias 0.1V Takahiro Yoshida, Jiro Ida, Takashi Horii (KIT), Masao Okihara (Lapis), Yasuo Arai (KEK) SDM2016-66 ICD2016-34 |
We have found out that the super steep Subthreshold Slope (SS) of the PN-body tied SOI FET appeared with the body voltag... [more] | SDM2016-66 ICD2016-34 pp.117-121 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 15:05 |
Osaka | Central Electric Club | Increased Drain-Induced Variability and Within-Device Variability in Extremely Narrow Silicon Nanowire MOSFETs with Width down to 2nm Tomoko Mizutani, Kiyoshi Takeuchi, Ryota Suzuki, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo) SDM2016-67 ICD2016-35 |
The effects of drain voltage in threshold voltage variability in extremely narrow silicon nanowire (NW) channel FETs are... [more] | SDM2016-67 ICD2016-35 pp.123-126 |
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