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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SIS, ITE-BCT | 2023-10-12 13:55 |
Yamaguchi | HISTORIA UBE (Primary: On-site, Secondary: Online) |
A study on multiplex transmission of program signals using STL/TTL for Advanced Integrated Services Digital Broadcasting - Terrestrial Tomohiro Shimazaki, Tetsuya Umenai, Hiroyasu Nagata, Takayuki Nakagawa (NHK) |
We have been studying an advanced studio-to-transmitter link / transmitter-to-transmitter link (STL/TTL) for Advanced In... [more] | |
| RCS, SAT (Joint) |
2023-08-31 09:50 |
Nagano | Naganoken Nokyo Building, and online (Primary: On-site, Secondary: Online) |
Improving Performance of LDM Transmission against Non-linear Distortion in Satellite Broadcasting System
-- Decoding Method of LL Signal with Pilot Signals -- Yuki Koizumi, Masaaki Kojima, Masashi Kamei (NHK)  SAT2023-35 |
We are developing a satellite broadcasting system with layered division multiplexing (LDM) scheme that multiplexes multi... [more] | SAT2023-35 pp.13-18 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-10-12 14:00 |
Niigata | Yuzawa Toei Hotel (Primary: On-site, Secondary: Online) |
A Don't Care Filling Algorithm of Control Signals for Concurrent Testing Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.) CPSY2022-24 DC2022-24 |
In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. ... [more] | CPSY2022-24 DC2022-24 pp.37-42 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:30 |
Online | Online | A Don't Care Filling Method of Control Signals for Concurrent Logical Fault Testing Haofeng Xu, Toshinori Hosokawa, Hiroshi Yamazaki, Masayuki Arai (Nihon Univ), Masayoshi Yoshimura (KSU) CPSY2021-56 DC2021-90 |
In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. ... [more] | CPSY2021-56 DC2021-90 pp.67-72 |
| DC | 2021-02-05 15:30 |
Online | Online | A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2020-77 |
A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as on... [more] | DC2020-77 pp.48-53 |
| DC | 2019-02-27 14:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Compaction Method for Test Sensitization State in Controllers Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.) DC2018-80 |
One of the challenges on VLSI testing is to reduce the area overhead of design-for-testability and to increase the fault... [more] | DC2018-80 pp.55-60 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 09:50 |
Kumamoto | Kumamoto-Kenminkouryukan Parea | On low power oriented test pattern compaction using SAT solver Yusuke Matsunaga (Kyushu Univ.) VLD2017-43 DC2017-49 |
This paper proposes a test pattern compaction method under power consumption constraint, which uses SAT solver based ... [more] |
VLD2017-43 DC2017-49 pp.95-99 |
| SIP, CAS, MSS, VLD | 2017-06-20 14:50 |
Niigata | Niigata University, Ikarashi Campus | SAT model sampling for test pattern generation considering signal transition activities Yusuke Matsunaga (Kyushu Univ.) CAS2017-21 VLD2017-24 SIP2017-45 MSS2017-21 |
This paper presents a test pattern generation method with considering signal transition activities using a SAT solver... [more] |
CAS2017-21 VLD2017-24 SIP2017-45 MSS2017-21 pp.107-112 |
| MSS | 2017-03-17 10:10 |
Shimane | Shimane Univ. | Dependency Analysis of Transitions in Retention-Free Petri Net Atsushi Mizuta, Qi-Wei GE, Hiroshi Matsuno (Yamaguchi Univ.) MSS2016-93 |
This paper aims to derive the transitions with dependent relation one another in retention-free Petri net. Firstly, ... [more] |
MSS2016-93 pp.67-72 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 09:50 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | On SAT based test pattern generation for transition faults considering signal activities Yusuke Matsunaga (Kyushu Univ.) VLD2016-63 DC2016-57 |
This paper presents a test pattern generation method with considering signal transition activities using a SAT solver... [more] |
VLD2016-63 DC2016-57 pp.111-115 |
| VLD, CAS, MSS, SIP | 2016-06-16 10:30 |
Aomori | Hirosaki Shiritsu Kanko-kan | On random test pattern generation algorithm considering signal transition activities Yusuke Matsunaga (Kyushu Univ.) CAS2016-4 VLD2016-10 SIP2016-38 MSS2016-4 |
This paper presents a test pattern generation method with considering signal transition activities using Markov chain... [more] |
CAS2016-4 VLD2016-10 SIP2016-38 MSS2016-4 pp.19-22 |
| ITS | 2016-05-28 16:55 |
Hokkaido | Hokkaido Univ | A Study on Positioning Method Assisted by Transition of Measurement on Reference Point Yuya Tochimura, Hiroyuki Hatano, Masahiro Fujii, Atsushi Ito, Yu Watanabe (Utsunomiya Univ.) ITS2016-6 |
The GPS (Global Positioning System) is the mainstream of estimating positional information. GPS estimation is performed... [more] |
ITS2016-6 pp.31-36 |
| MSS | 2016-03-03 15:50 |
Yamaguchi | KAIKYO MESSE SHIMONOSEKI | Properties of Uniqueness on Dependent Shrink for Retention-Free Petri Nets Atsushi Mizuta, Qi-Wei Ge, Hiroshi Matsuno (Yamaguchi Univ.) MSS2015-75 |
We have investigated the relation of transitions based on dependency of transitions and proposed dependent shrink algori... [more] | MSS2015-75 pp.41-46 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 14:40 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | On discrimination method of a resistive open using delay variation induced by signal transitions on adjacent lines Kotaro Ise, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) VLD2015-42 DC2015-38 |
The effect of a resistive open results in small delay in an IC. It is difficult to test small delay since signal delay a... [more] | VLD2015-42 DC2015-38 pp.31-36 |
| EMT, IEE-EMT | 2015-10-29 15:25 |
Miyazaki | Holiday Inn ANA Resort Miyazaki | Radar signal processing based on a state transition model and its application to target identification Masahiko Nishimoto (Kumamoto Univ.) EMT2015-66 |
This report discusses an approach for radar target classification and identification using multi-aspect radar data. Firs... [more] | EMT2015-66 pp.115-118 |
| MSS | 2015-03-05 17:05 |
Ishikawa | IT Business Plaza Musashi | Equivalent Transformation of Retention-Free Petri Net by Dependent Shrink Atsushi Mizuta, Qi-Wei Ge, Hiroshi Matsuno (Yamaguchi Univ.) MSS2014-98 |
We have investigated the properties of dependent shrink based on dependency of transitions in retention-free Petri net m... [more] | MSS2014-98 pp.41-46 |
| NS | 2013-04-19 13:55 |
Ishikawa | The Wajima Chamber of Commerce and Industry | A Method for Controlling a State Transition of a Mobile Terminal Based on Radio Resource Consumption Takanori Iwai, Masayoshi Shimizu, Hiroshi Yoshida, Takashi Yoshikawa (NEC) NS2013-9 |
In mobile cellular networks, in order to reduce the power consumption of a mobile terminal and the radio resources of a ... [more] | NS2013-9 pp.43-48 |
| DC | 2013-02-13 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Characteristic Analysis of Signal Delay for Resistive Open Fault Detection Hiroto Ohguri, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2012-84 |
When a resistive open fault occurs, signal delay at the faulty wire may degrade circuit performance. However, a resistiv... [more] | DC2012-84 pp.25-30 |
| MSS | 2013-01-22 15:15 |
Osaka | Osaka Int. Convention Center | An Algorithm of Finding Dependent Subnets for Retention-Free Petri Nets Tadataka Matsumoto, Qi-Wei Ge, Hiroshi Matsuno (Yamaguchi Univ.) MSS2012-50 |
In this paper, we examine a dependency relationship among transitions in the retention-free Petri net model of a signal... [more] |
MSS2012-50 pp.27-32 |
| IE, SIP, ICD, VLD, IPSJ-SLDM [detail] | 2012-10-19 14:55 |
Iwate | Hotel Ruiz | Fast Estimation of Dynamic Delay Distribution Dai Akita, Kenta Ando (Osaka Univ.), Atsushi Takahashi (Tokyo Tech.) VLD2012-55 SIP2012-77 ICD2012-72 IE2012-79 |
As the improvement of digital circuits with fixed latency is about to reach its own limits, it is expected that variable... [more] | VLD2012-55 SIP2012-77 ICD2012-72 IE2012-79 pp.83-88 |
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