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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
R |
2017-11-16 14:25 |
Osaka |
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The Electrochemical Migration Test Using Condensation Cycle Test Takaaki Semba, Katsuyuki Ishizu, Takafumi Fujisawa (MMC) R2017-51 |
(To be available after the conference date) [more] |
R2017-51 pp.5-8 |
SDM |
2009-10-29 17:15 |
Miyagi |
Tohoku University |
Statistical Analysis of Random Telegraph Signal Using a Large-Scale Array TEG with a Long Time Measurement Takafumi Fujisawa, Kenichi Abe, Syunichi Watabe, Naoto Miyamoto, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2009-123 |
For the development of miniaturizing MOSFET and manufacturing low noise devices, it is important to suppress RTS noise. ... [more] |
SDM2009-123 pp.31-36 |
SDM, ED |
2009-06-24 16:45 |
Overseas |
Haeundae Grand Hotel, Busan, Korea |
A Statistical Analysis of Distributions of RTS Characteristics by Wide-Range Sampling Frequencies Kenichi Abe, Takafumi Fujisawa, Akinobu Teramoto, Syunichi Watabe, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) ED2009-57 SDM2009-52 |
[more] |
ED2009-57 SDM2009-52 pp.29-32 |
SDM |
2008-10-10 14:00 |
Miyagi |
Tohoku Univ. |
Statistical evaluation of characteristics variation and RTS noise of MOSFETs Takafumi Fujisawa, Shigetoshi Sugawa, Syunichi Watabe, Kenichi Abe, Akinobu Teramoto, Tadahiro Ohmi (Tohoku Univ.) SDM2008-163 |
[more] |
SDM2008-163 pp.45-50 |
SDM |
2008-10-10 15:15 |
Miyagi |
Tohoku Univ. |
Correlation between Stress Induced Leakage Current and Random Telegraph Signal noise Yuki Kumagai, Akinobu Teramoto, Kenichi Abe, Takafumi Fujisawa, Syunichi Watabe, Tomoyuki Suwa, Naoto Miyamoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2008-165 |
In this paper, we report the correlation between anomalous stress-induced leakage current (SILC) and random telegraph si... [more] |
SDM2008-165 pp.57-62 |
SDM |
2007-10-05 16:15 |
Miyagi |
Tohoku Univ. |
Statistical Evaluation of Characteristics Variability caused by Plasma Processes Syunichi Watabe, Shigetoshi Sugawa, Kenichi Abe, Takafumi Fujisawa, Naoto Miyamoto, Akinobu Teramoto, Tadahiro Ohmi (Tohoku Univ.) SDM2007-193 |
In this paper, we report the statistical evaluation of characteristics degradation in MOSFETs caused by plasma damages w... [more] |
SDM2007-193 pp.69-72 |
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