| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| LOIS, IPSJ-SPT, IPSJ-CN | 2023-05-26 10:55 |
Tokyo | (Primary: On-site, Secondary: Online) |
 LOIS2023-2 |
A graph document is a representation of the logical structure of a document in terms of a graph. A graph document has no... [more] | LOIS2023-2 pp.9-12 |
| SDM | 2019-01-29 13:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Interface Dipole Modulation Memory based on Multi-stacked HfO2/SiO2 MOS Structure Noriyuki Miyata (AIST), Jun Nara, Takahiro Yamasaki (NIMS), Kyoko Sumita (AIST), Ryousuke Sano, Hiroshi Nohira (TCU) SDM2018-87 |
We report an electric-field-induced interface dipole modulation (IDM) in HfO2/1-ML TiO2/SiO2 MOS stack structures. Exper... [more] | SDM2018-87 pp.27-30 |
| SDM, EID | 2016-12-12 13:30 |
Nara | NAIST | First-Principles Calculation Studies of Resistive Switching Mechanism in Polycrystalline Metal Oxide Film Takumi Moriyama, Sohta Hida (Tottori Univ.), Takahiro Yamasaki, Takahisa Ohno (NIMS), Satoru Kishida, Kentaro Kinoshita (Tottori Univ.) EID2016-18 SDM2016-99 |
For practical use of Resistive Random Access Memory (ReRAM), clarifying physical properties of conducting path created i... [more] | EID2016-18 SDM2016-99 pp.41-44 |
| SDM, EID | 2014-12-12 17:45 |
Kyoto | Kyoto University | Study on Formative Mechanism of Conductive Path in Resistive Random Access Memory (ReRAM)
-- Analyses of Various NiO Surface States Using Ab Initio Calculations -- Takumi Moriyama (Tottori Univ.), Takahiro Yamasaki, Takahisa Ohno (NIMS), Satoru Kishida, Kentaro Kinoshita (Tottori Univ.) EID2014-39 SDM2014-134 |
For practical use of Resistive Random Access Memory (ReRAM), clarifying physical properties of conducting path created i... [more] | EID2014-39 SDM2014-134 pp.135-138 |
| SDM | 2013-12-13 15:40 |
Nara | NAIST | Elucidation of Metal Diffusion Mechanism in Conducting-Bridge Random Access Memory (CB-RAM) Using Ab Initio Calculation Sho Yura (Tottori Univ.), Takahiro Yamasaki (NIMS), Kengo Nakada, Akira Ishii (Tottori Univ.), Satoru Kishida, Kentaro Kinoshita (Tottori Univ./TEDREC) |
[more] | |
| CQ | 2013-07-12 10:15 |
Hokkaido | Hokkaido University | 3D Video Quality Assessment Test in a Packet Loss Network Takahiro Yamasaki, Takashi Nishi (OKI) CQ2013-23 |
3D video communication would be expected to enrich remote office communication. Usually, remote office communication car... [more] | CQ2013-23 pp.55-60 |
| CQ | 2012-07-13 13:35 |
Ehime | Ehime Univ. | 3D Video Quality Assessment Test for Interoffice Communication Takahiro Yamasaki, Takashi Nishi, Masato Nonaka (OKI) CQ2012-36 |
3D video communication would be expected to enrich remote office communication. Usually, remote office communication car... [more] | CQ2012-36 pp.113-117 |
| IT | 2007-01-30 14:00 |
Osaka | Osaka Electro-Communication University | On Double Cluster-Error Correcting Capability of Two-Dimensional Linear Codes Ken-ichi Mizukami, Yusuke Orii, Kin-ichiroh Tokiwa, Takahiro Yamasaki (OSU) |
[more] | IT2006-54 pp.25-29 |
| SDM | 2006-06-22 13:35 |
Hiroshima | Faculty Club, Hiroshima Univ. | The effect on thermal stability by nitrogen atoms in HfO2-based gate dielectrics Norihiko Takahashi, Takahiro Yamasaki, Chioko Kaneta (FUJITSU LABORATORIES LTD.) |
[more] | SDM2006-60 pp.103-106 |
[Return to Top Page]